EWT801-SM Datasheet, PDF (14/26 Pages) Seoul Semiconductor – Applicable for automotive interior light

Reliability Test
Test Item
Standard
Test Method
External Visual
JESD22 B-101
Product Data Sheet
EWT801-SM - 801 Series White
Test Condition
Visual inspection
Duration
/ Cycle
Number
Of Test
-
77
D.P.A
AEC-Q101-004
Random Sample H3TRB,HAST,TC
-
5
ESD
JESD22 A-114
Human-body mode,
R=1.5㏀, C = 100pF
3 times
Negative/
30
Positive
Physical Dimension
JESD22 B-100
Verify physical dimensions against
device mechanical drawing
3 times
30
Parametric Verification JESD22 A-108
25℃, 1000 hours @30mA
1000hrs
77
Temperature cycling
JESD22 A-104
Tc= -55°∼125°C, 30 min. dwell,
5 min transfer, 1000 cycles
1000hrs
77
Ta=-40℃~85℃, If =25mA,
Power Temperature Cycle JESD22 A-105
20 min dwell / 20 min transition
1000hrs
77
(1 hour cycle), 2 min ON / 2 min OFF
High Humidity High Temp.
Operating Life
JESD22 A-101
85℃/85% RH, @25mA
1000hrs
77
High Temperature
Operating Life
Solder ability
JESD22 A-108C
JESD22B-102
Resistance to
Solder Heat
JESD22A-111
Thermal Resistance
JESD24
Wire Bond Strength
MIL-STD-750
Bond Shear
AEC-Q101-003
Die Shear
MIL-STD-750
Ta= 85°C, If =25mA
1000hrs
77
Bake : 150 ℃
Dipping terminal to 245 ℃
-
10
Preconditioned at MSL 2a
Bake : 125 ℃,
Soak : 60 ℃, 60 % R.H.
-
10
Full body immersion to 260 ℃.
Measure TR to assure
specification compliance
-
10
Pull test to assure
specification compliance
-
10
Shear test to assure
specification compliance
-
10
Shear test to assure
specification compliance
-
10
Criteria for Judging the Damage
Item
Symbol
Forward Voltage
V_F
Luminous Intensity
I_V
Condition
I_F =20mA
I_F =20mA
Criteria for Judgment
MIN
MAX
-
Initial × 1.2
Initial × 0.8
-
Rev1.0, Jan 12, 2016
14
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