HYT801-S Datasheet, PDF (13/25 Pages) Seoul Semiconductor – Applicable for automotive interior light

Reliability Test
Test Item
Standard
Test Method
External Visual
JESD22 B-101
D.P.A
AEC-Q101-004
Vibration
JESD22 B-103
ESD
JESD22 A-114
Physical Dimension
JESD22 B-100
Mechanical Shock
JESD22 B-104
Parametric Verification JESD22 A-108
Temperature cycling
JESD22 A-104
Power Temperature
Cycle
JESD22 A-105
High Humidity High Temp.
Operating Life
JESD22 A-101
High Temperature
Operating Life
Low Temperature
Operating Life
Low Temperature
Storage Life
High Temperature
Storage Life
JESD22 A-108C
JESD22 A-108C
JESD22 A-119
JESD22 A-103B
Thermal Shock
JESD22 A-104
Product Data Sheet
HYT801-S - 801 Series Yellow
Test Condition
Visual inspection
Duration Number
/ Cycle Of Test
-
77
Random Sample H3TRB,HAST,TC
-
5
0.06 inch displacement,
20 to 100 Hz,
50 g 100 Hz to 2kHz,
Human-body mode,
R=1.5㏀, C = 100pF
Verify physical dimensions against
device mechanical drawing
1500 g's for 0.5 ms,
5 blows, 3 orientations
4 times
30
3 times
Negative/
30
Positive
3 times
30
3 times
30
25℃, 1000 hours @30mA
1000hrs
77
Tc= -55°∼125°C, 30 min. dwell,
5 min transfer, 1000 cycles
1000hrs
77
Ta=-40℃~85℃, If =25mA,
20 min dwell / 20 min transition
1000hrs
77
(1 hour cycle), 2 min ON / 2 min OFF
85℃/85% RH, @ 30mA
1000hrs
77
Ta= 85°C, If =30mA
Ta= -40°C, If = 30mA
Ta=-40°C, non-operating
Ta=85°C, non-operating
-40°C ~ 100°C,
20 min. dwell, <10 second transfer,
1000 cycles
1000hrs
77
1000hrs
77
1000hrs
77
1000hrs
77
1000hrs
77
Criteria for Judging the Damage
Item
Symbol
Forward Voltage
V_F
Luminous Intensity
I_V
Rev3.0, Aug 26, 2015
Condition
I_F =10mA
I_F =10mA
13
Criteria for Judgment
MIN
MAX
-
Initial × 1.2
Initial × 0.8
-
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