EYT809-S Datasheet, PDF (13/25 Pages) Seoul Semiconductor – Applicable for automotive interior light

Reliability Test
Test Item
Standard
Test Method
External Visual
JESD22 B-101
Product Data Sheet
EYT809-S – 809 Series Yellow
Test Condition
Visual inspection
Duration Number
/ Cycle
Of Test
-
77
D.P.A
AEC-Q101-004
Random Sample H3TRB,HAST,TC
-
5
Vibration
ESD
JESD22 B-103
JESD22 A-114
0.06 inch displacement,
20 to 100 Hz,
50 g 100 Hz to 2kHz,
Human-body mode,
R=1.5㏀, C = 100pF
4 times
30
3 times
Negative/
30
Positive
Physical Dimension
JESD22 B-100
Verify physical dimensions against
device mechanical drawing
3 times
30
Mechanical Shock
JESD22 B-104
1500 g's for 0.5 ms,
5 blows, 3 orientations
3 times
30
Parametric Verification JESD22 A-108
25℃, 1000 hours @30mA
1000hrs
77
Temperature cycling
JESD22 A-104
Tc= -40°∼100°C, 30 min. dwell,
5 min transfer, 1000 cycles
1000hrs
77
Ta=-40℃~85℃, If =28mA,
Power Temperature Cycle JESD22 A-105
20 min dwell / 20 min transition
1000hrs
77
(1 hour cycle), 2 min ON / 2 min OFF
High Humidity High Temp.
Operating Life
JESD22 A-101
85℃/85% RH, @ 28mA
1000hrs
77
High Temperature
Operating Life
JESD22 A-108C
Ta= 100°C, If =19mA
1000hrs
77
Low Temperature
Operating Life
JESD22 A-108C
Ta= -40°C, If = 30mA
1000hrs
77
Low Temperature
Storage Life
JESD22 A-119
Ta=-40°C, non-operating
1000hrs
77
High Temperature
Storage Life
JESD22 A-103B
Ta=100°C, non-operating
1000hrs
77
Thermal Shock
-40°C ~ 100°C,
JESD22 A-104
20 min. dwell, <10 second transfer, 1000hrs
77
1000 cycles
Criteria for Judging the Damage
Item
Symbol
Forward Voltage
V_F
Luminous Intensity
I_V
Condition
I_F =20mA
I_F =20mA
Criteria for Judgment
MIN
MAX
-
Initial × 1.2
Initial × 0.8
-
Rev4.0, Sep 22, 2015
13
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