LM4001G Datasheet, PDF (1/2 Pages) SEMTECH ELECTRONICS LTD. – SURFACE MOUNT GLASS PASSIVATED SILICON RECTIFIERS

LM4001G THRU LM4007G
SURFACE MOUNT GLASS PASSIVATED SILICON RECTIFIERS
Reverse Voltage - 50 to 1000 V
Forward Current - 1 A
Features
• The plastic package carries Underwrites Laboratory
Flammability classification 94V-0
• For surface mounted application
• Glass passivated junction
Mechanical Data
• Case: MiniMELF(DO-213AA), molded plastic body
• Terminals: Lead solderable per MIL-STD-750,
method 2026
• Polarity: Color band denotes cathode end
• Mounting Position: Any
MiniMELF (DO-213AA) Plastic Package
Maximum Ratings and Electrical characteristics
Ratings at 25 ^OC ambient temperature unless otherwise specified. Single phase, half wave, 60 Hz, resistive or inductive load.
For capacitive load, derate current by 20%.
Parameter
Symbols LM4001G LM4002G LM4003G LM4004G LM4005G LM4006G LM4007G Units
Maximum Recurrent Peak Reverse Voltage
V_RRM
50
100 200 400 600 800 1000 V
Maximum RMS Voltage
V_RMS
35
70 140 280 420 560 700 V
Maximum DC Blocking Voltage
V_DC
50 100 200 400 600 800 1000 V
Maximum Average Forward Rectified Current at T_A = 75 ^OC
I_(AV)
Peak Forward Surge Current 8.3 ms Single Half Sine Wave
Superimposed on Rated Load (JEDEC Method)
I_FSM
1
A
25
A
Maximum Forward Voltage at 1 A
V_F
1.1
Maximum Reverse Current
at Rated DC Blocking Voltage
T_A = 25 ^OC
T_A = 125 ^OC
I_R
5
50
Typical Junction Capacitance ¹⁾
C_J
15
Typical Thermal Resistance ²⁾
Typical Thermal Resistance ³⁾
R_θJA
75
R_θJL
30
Operating and Storage Temperature Range
T_j,T_stg
- 65 to + 175
1) _{Measured at 1 MHz and applied reverse voltage of 4 V D.C}
2) _{Thermal resistance from junction to ambient, 0.24 X 0.24" (6 X 6 mm) copper pads to each terminal}
3) _{Thermal resistance from junction to terminal, 0.24 X 0.24" (6 X 6 mm) copper pads to each terminal}
V
µA
pF
O_C/W
O_C/W
O_C
SEMTECH ELECTRONICS LTD.
(Subsidiary of Sino-Tech International Holdings Limited, a company
listed on the Hong Kong Stock Exchange, Stock Code: 724)
®
Dated : 10/12/2008 N