E8404A Datasheet, PDF (1/1 Pages) Semtech Corporation – 100-500MHz Dual Channel, Digitally Programmed Pin Electronics Solution

TEST AND MEASUREMENT PRODUCTS
Description
E8404A
100-500MHz Dual Channel, Digitally
Programmed Pin Electronics Solution
PRELIMINARY
Features
The E8404A has a Driver and Window Comparator receiver
and commutating Load Circuit for each channel with perfor-
mance settings to save power or maximize bandwidth.
All level’s DACs for the Driver, Receiver and Load are on-chip
and are programmed via a high speed serial bus. Each of
the level’s DACs have offset and gain registers for on-chip
calibrations.
The Driver circuit is capable of forcing two levels to the DUT
(DVH and DVL) as well as a third voltage for a termination
level (DVT) to terminate high-speed DUT signals to the Com-
parator receivers into a high quality 50Ω load. The Driver
can also be configured to a high impedance (HiZ) state for
an open termination of DUT signals.
Waveform clamps are also available to clip the input signals
from a DUT when not using the Driver as a termination.
The clamps prevent reflections from returning to the DUT
transmission line which can create timing errors and false
triggering.
• Two Fully Integrated Pin Channels including:
- 16-bit DACs for each level
- Tri-level Driver
- Window Receiver
- 4mA/40mA Ranged Active Commutating Load
- Waveform Clamps
• Driver, Comparator and Load maximum 8V span over
-2 to +7V range
• Configurable Output Protection
• 50MHz Serial Bus Programming
- SPI™/QSPI™/ MICROWIRE™
- Daisy-chainable
• Power Dissipation
~0.9W/Channel (quiescent, Low Perf, I/O mode)
~1.0W/Channel (quiescent, High Perf, I/O mode)
• Pin and Software Compatible to E8400, E8405, E8410,
E8415
• Digitally Programmable Performance/Power
• Differential Drive and Receive Functionality
• Optimal Small Swing Performance
• Small 11mm x 11mm Package
All of the on-chip DAC levels and configuration registers
for each channel may be programmed via SET commands.
This PinCast method of programming allows all channels in
a system to be programmed concurrently with a simple set
command whereby any pin channel that had been assigned
to that set will respond.
The two driver circuits may be placed into a differential drive
mode. This reduces driver-to-driver skews to levels difficult to
achieve by external deskewing. The two window comparators
may also be placed into a differential receive mode. These
features enable higher quality testing of differential signals
to/from the DUT.
Applications
• Logic Testers
• Mixed-Signal Test Equipment
• Memory Testers
• Flash Memory Testers
• ASIC Verifiers
SPI and QSPI and trademarks of Motorola, Inc.
MICROWIRE is a trademark of National Semiconductor Corp.
Functional Block Diagram
DC
BUSY*
CS*
C
CLK
O
N
SDIN
T
SDOUT
R
RESET*
O
INT*
L
SLEEP*
TEST_MODE
DHI*
DHI
DEN
DEN*
QA*
QA
QB
QB*
REF_IN_HI
REF_IN_LO
QB*
QB
QA
QA*
DHI*
DHI
DEN
DEN*
GND_SNS
ISK
VCM
ISC
DVH
DVT
DVL
CVA
A
B
CVB
VCH
VCL
CH 0
CVB
B
A
CVA
DVL
CH 1
VCH
VCL
DVH
DVT
ISK
VCM
ISC
CAL_ S[0]
DUTIO_S[0]
DUTIO_F[0]
VCC
VAA
VDD
VEE
GND
ANODE_S
ANODE_F
RREF1[0]
RREF2[0]
RREF1[1]
RREF2[1]
DUTIO_F[1]
DUTIO_S[1]
CAL_S[1]
Revision 3, November 2, 2007

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