E8400B Datasheet, PDF (1/1 Pages) Semtech Corporation – 100-500MHz Dual Channel, Digitally Programmed Pin Electronics Solution

TEST AND MEASUREMENT PRODUCTS
Description
E8400B
100-500MHz Dual Channel, Digitally
Programmed Pin Electronics Solution
Features
PRELIMINARY
The E8400B has a Driver and Window Comparator receiver
for each channel with performance settings to save power
or maximize bandwidth. Also present is a PMU per chan-
nel that also doubles as a resistive load function to the DUT.
Each PMU has a 16-bit ADC for analog parametric measure-
ment.
All level’s DACs for the Driver, Receiver and PMU are on-chip
and are programmed via a high speed serial bus. Each of
the level’s DACs have offset and gain registers for on-chip
calibrations.
The Driver circuit is capable of forcing two levels to the DUT
(DVH and DVL) as well as a third voltage for a termination
level (DVT) to terminate high-speed DUT signals to the Com-
parator receivers into a high quality 50Ω load. The Driver
can also be configured to a high impedance (HiZ) state for
an open termination of DUT signals.
Waveform clamps are also available to clip the input signals
from a DUT when not using the Driver as a termination.
The clamps prevent reflections from returning to the DUT
transmission line which can create timing errors and false
triggering.
All of the on-chip DAC levels and configuration registers
for each channel may be programmed via SET commands.
This PinCast method of programming allows all channels in
a system to be programmed concurrently with a simple set
command whereby any pin channel that had been assigned
to that set will respond.
The two driver circuits may be placed into a differential drive
mode. This reduces driver-to-driver skews to levels difficult to
achieve by external deskewing. The two window comparators
may also be placed into a differential receive mode. These
features enable higher quality testing of differential signals
to/from the DUT.
• Two Fully Integrated Pin Channels including:
- 16-bit DACs for each level
- Tri-level Driver
- Window Receiver
- Parametric Measurement Unit
- Thevinen Load
- Waveform Clamps
- 16-bit ADC for PMU measurements
• Driver, Comparator and PMU maximum 8V span over
-2 to +7V range
• Configurable Output Protection
• 4 PMU current ranges; 24mA, 2.4mA, 240μA, 24μA
• On-Chip ADC for each PMU
• 50MHz Serial Bus Programming
- SPI™/QSPI™/ MICROWIRE™
- Daisy-chainable
• Power Dissipation
~0.8W/Channel (quiescent, low performance, I/O Mode)
~0.9W/Channel (quiescent, high performance, I/O Mode)
• Pin and Software Compatible with E8410, E8405, E8415
• Digitally Programmable Performance/Power
• Differential Drive and Receive Functionality
• Optimal Small Swing Performance
• Small 11mm x 11mm Package
Functional Block Diagram
C
O
N
SERIAL IO
T
R
O
L
DEN
DHI
QA
QB
VFRC
IFRC
TESTH
TESTL
DVH
P^PM^MU^U
CLH
CLL
IVMON0
PMUF
PMUS
DVT
DVL
CVA
A
B
CVB
VCH
VCL
CH 0
DUTIO[0]
Applications
• Logic Testers
• Mixed-Signal Test Equipment
• Memory Testers
• Flash Memory Testers
• ASIC Verifiers
SPI and QSPI and trademarks of Motorola, Inc.
MICROWIRE is a trademark of National Semiconductor Corp.
Revision 5, October 30, 2007
QB
QA
DHI
DEN
IVMON_HI
IVMON_LO
GND_SNS

CVB
B
A
CVA
DVL
CH 1
VCH
VCL
DUTIO[1]
A/D
IVMON0
IVMON1
A/D
DVH
DVT
TESTL
TESTH
IFRC
VFRC
P_PM_MUU
PMUS
PMUF
IVMON1
CLL
CLH
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