D1207UK Datasheet, PDF (2/2 Pages) Seme LAB – METAL GATE RF SILICON FET

D1207UK
ELECTRICAL CHARACTERISTICS (T_case = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
PER SIDE
BV_DSS
Drain–Source Breakdown
Voltage
V_GS = 0
I_D = 10mA
40
I_DSS
Zero Gate Voltage
Drain Current
V_DS = 12.5V
V_GS = 0
I_GSS
Gate Leakage Current
V_GS = 20V
V_DS = 0
V_GS(th) Gate Threshold Voltage*
I_D = 10mA
V_DS = V_GS
1
g_fs
Forward Transconductance*
V_DS = 10V
I_D = 1A
0.8
TOTAL DEVICE
G_PS
Common Source Power Gain P_O = 20W
10
η
Drain Efficiency
V_DS = 12.5V
I_DQ = 0.8A
50
VSWR Load Mismatch Tolerance
f = 400MHz
20:1
C_iss
C_oss
C_rss
PER SIDE
Input Capacitance
V_DS = 0
V_GS = –5V f = 1MHz
Output Capacitance
V_DS = 12.5V V_GS = 0 f = 1MHz
Reverse Transfer Capacitance V_DS = 12.5V V_GS = 0 f = 1MHz
* Pulse Test: Pulse Duration = 300 µs , Duty Cycle ≤ 2%
Typ.
Max. Unit
V
1
mA
1
µA
7
V
S
dB
%
—
60
pF
40
pF
4
pF
HAZARDOUS MATERIAL WARNING
The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly
toxic and care must be taken during handling and mounting to avoid damage to this area.
THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.
THERMAL DATA
R_{THj–case}
Thermal Resistance Junction – Case
Max. 1.75°C / W
Semelab plc. Telephone [phone]. Telex: 341927. Fax [phone].
Prelim. 10/95