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SML5020BN Datasheet, PDF (1/2 Pages) Seme LAB – 4TH GENERATION MOSFET
SEME
LAB
SML5020BN
TO247–AD Package Outline.
Dimensions in mm (inches)
4.69 (0.185)
5.31 (0.209)
1.49 (0.059)
2.49 (0.098)
15.49 (0.610)
16.26 (0.640)
3.55 (0.140)
3.81 (0.150)
4TH GENERATION MOSFET
N–CHANNEL
ENHANCEMENT MODE
HIGH VOLTAGE
POWER MOSFETS
0.40 (0.016)
0.79 (0.031)
123
1.65 (0.065)
2.13 (0.084)
2.87 (0.113)
3.12 (0.123)
1.01 (0.040)
1.40 (0.055)
2.21 (0.087)
2.59 (0.102)
5.25 (0.215)
BSC
Pin 1 – Gate
Pin 2 – Drain
Pin 3 – Source
VDSS
ID(cont)
RDS(on)
500V
28.0A
0.20W
ABSOLUTE MAXIMUM RATINGS (Tcase = 25°C unless otherwise stated)
VDSS
Drain – Source Voltage
ID
Continuous Drain Current
IDM
Pulsed Drain Current 1
VGS
Gate – Source Voltage
Total Power Dissipation @ Tcase = 25°C
PD
Derate Linearly
TJ , TSTG
TL
Operating and Storage Junction Temperature Range
Lead Temperature : 0.063” from Case for 10 Sec.
STATIC ELECTRICAL RATINGS (Tcase = 25°C unless otherwise stated)
BVDSS
Characteristic
Drain – Source Breakdown Voltage
Test Conditions
m VGS = 0V , ID = 250 A
IDSS
IGSS
VGS(TH)
Zero Gate Voltage Drain Current
(VGS = 0V)
Gate – Source Leakage Current
Gate Threshold Voltage
VDS = VDSS
VDS = 0.8VDSS , TC = 125°C
VGS = ±30V , VDS = 0V
VDS = VGS , ID = 1.0mA
ID(ON)
RDS(ON)
On State Drain Current 2
Drain – Source On State Resistance 2
VDS > ID(ON) x RDS(ON) Max
VGS = 10V
VGS = 10V , ID = 0.5 ID [Cont.]
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.
m 2) Pulse Test: Pulse Width < 380 S , Duty Cycle < 2%
500
28
112
±30
360
2.9
–55 to 150
300
V
A
A
V
W
W/°C
°C
Min. Typ. Max. Unit
500
V
250 mA
1000
±100 nA
2
4V
28
A
0.20 W
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk
Prelim. 6/94