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SMG2342N_15 Datasheet, PDF (2/2 Pages) SeCoS Halbleitertechnologie GmbH – N-Channel Enhancement Mode Mos.FET
Elektronische Bauelemente
SMG2342N
5.2 A, 40 V, RDS(ON) 86 m
N-Channel Enhancement Mode Mos.FET
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)
Parameter
Symbol Min. Typ. Max. Unit
Test Conditions
Gate-Threshold Voltage
VGS(th)
1.0
-
-
V VDS=VGS, ID= 250uA
Gate-Body Leakage
IGSS
-
-
±100 nA VDS= 0V, VGS= 20V
Zero Gate Voltage Drain Current
On-State Drain Current 1
-
-
1
VDS= 32V, VGS= 0V
IDSS
uA
-
-
25
VDS= 32V, VGS= 0V, TJ= 55°C
ID(on)
20
-
-
A VDS = 5V, VGS= 10V
Drain-Source On-Resistance 1
Forward Transconductance 1
-
RDS(ON)
-
gfs
-
-
86
VGS= 10V, ID= 5.2A
mΩ
-
128
VGS= 4.5V, ID= 3.7A
40
-
S VDS= 15V, ID= 5.2A
Diode Forward Voltage
VSD
-
0.7
-
Dynamic 2
V IS= 2.3A, VGS= 0V
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Qg
-
4.0
-
Qgs
-
1.1
-
nC
VDS= 15V, VGS= 4.5V,
ID= 5.2A
Qgd
-
1.4
-
Turn-on Delay Time
Td(on)
-
16
-
Rise Time
Turn-off Delay Time
Tr
Td(off)
-
-
5
23
-
-
nS
VDD= 25V, VGEN= 10V,
RL= 25, ID= 1A
Fall Time
Tf
-
3
-
Notes
1
2
Pulse test:PW ≦ 300 us duty cycle ≦ 2%.
Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
30-Dec-2010 Rev. A
Any changes of specification will not be informed individually.
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