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S-25A080A Datasheet, PDF (6/31 Pages) Seiko Instruments Inc – 125°C OPERATION SPI SERIAL E2PROM | |||
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125°C OPERATION SPI SERIAL E2PROM FOR AUTOMOTIVE ELECTRIC COMPONENT
S-25A080A/160A/320A
Rev.1.0_00
Table 11
â40°C to +125°C
Item
Symbol VCC = 2.5 V to 5.5 V VCC = 3.0 V to 5.5 V VCC = 4.5 V to 5.5 V Unit
Min.
Max.
Min.
Max.
Min.
Max.
SCK clock frequency
fSCK
â
3.5
â
5.0
â
6.5
MHz
CS setup time during CS
falling
tCSS.CL
90
â
90
â
65
â
ns
CS setup time during CS
rising
tCSS.CH
90
â
90
â
65
â
ns
CS deselect time
tCDS
160
â
140
â
110
â
ns
CS hold time during CS falling tCSH.CL
90
â
90
â
65
â
ns
CS hold time during CS rising tCSH.CH
90
â
90
â
65
â
ns
SCK clock time âHâ *1
SCK clock time âLâ *1
Rising time of SCK clock *2
Falling time of SCK clock *2
tHIGH
125
â
95
â
65
â
ns
tLOW
125
â
95
â
65
â
ns
tRSK
â
1
â
1
â
1
µs
tFSK
â
1
â
1
â
1
µs
SI data input setup time
tDS
20
â
20
â
20
â
ns
SI data input hold time
tDH
30
â
30
â
30
â
ns
SCK âLâ hold time
during HOLD rising
tSKH.HH
70
â
70
â
45
â
ns
SCL âLâ hold time
during HOLD falling
tSKH.HL
40
â
40
â
30
â
ns
SCK âLâ setup time
during HOLD falling
tSKS.HL
0
â
0
â
0
â
ns
SCK âLâ setup time
during HOLD rising
tSKS.HH
0
â
0
â
0
Disable time of SO output *2
tOZ
â
100
â
100
â
Delay time of SO output
tOD
â
120
â
90
â
Hold time of SO output
Rising time of SO output *2
Falling time of SO output *2
tOH
0
â
0
â
0
tRO
â
80
â
80
â
tFO
â
80
â
80
â
Disable time of SO output
during HOLD falling *2
tOZ.HL
â
100
â
100
â
â
ns
75
ns
60
ns
â
ns
50
ns
50
ns
75
ns
Delay time of SO output
during HOLD rising *2
tOD.HH
â
80
â
80
â
60
ns
WP setup time
tWS1
0
â
0
â
0
â
ns
WP hold time
tWH1
0
â
0
â
0
â
ns
WP release / setup time
tWS2
0
â
0
â
0
â
ns
WP release / hold time
tWH2
150
â
150
â
100
â
ns
*1. The clock cycle of the SCK clock (frequency fSCK) is 1/fSCK µs. This clock cycle is determined by a combination of
several AC characteristics. Note that the clock cycle cannot be set as (1/fSCK) = tLOW (Min.) + tHIGH (Min.) by minimizing
the SCK clock cycle time.
*2. These are values of sample and not 100% tested.
6
Seiko Instruments Inc.
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