ATP404 Datasheet, PDF (2/4 Pages) Sanyo Semicon Device – General-Purpose Switching Device Applications

ATP404
Continued from preceding page.
Parameter
Symbol
Cutoff Voltage
Forward Transfer Admittance
Static Drain-to-Source On-State Resistance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-ON Delay Time
Rise Time
Turn-OFF Delay Time
Fall Time
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain “Miller” Charge
Diode Forward Voltage
VGS(off)
| yfs |
RDS(on)1
RDS(on)2
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
VSD
Conditions
VDS=10V, ID=1mA
VDS=10V, ID=48A
ID=48A, VGS=10V
ID=48A, VGS=4.5V
VDS=20V, f=1MHz
VDS=20V, f=1MHz
VDS=20V, f=1MHz
See specified Test Circuit.
See specified Test Circuit.
See specified Test Circuit.
See specified Test Circuit.
VDS=30V, VGS=10V, ID=95A
VDS=30V, VGS=10V, ID=95A
VDS=30V, VGS=10V, ID=95A
IS=95A, VGS=0V
Package Dimensions
unit : mm (typ)
7057-001
6.5
4
1.5
0.4
4.6
2.6
0.4
Ratings
Unit
min
typ
max
1.2
2.6
V
100
S
5.5
7.2 mΩ
7.5
10.5 mΩ
6400
pF
490
pF
380
pF
53
ns
640
ns
380
ns
520
ns
120
nC
25
nC
25
nC
0.95
1.2
V
2
1
3
0.8
0.6
2.3 2.3
0.55
0.4
1 : Gate
2 : Drain
3 : Source
4 : Drain
SANYO : ATPAK
Switching Time Test Circuit
VIN
10V
0V
VIN
PW=10μs
D.C.≤1%
G
VDD=30V
ID=48A
RL=0.625Ω
D
VOUT
ATP404
P.G
50Ω
S
Avalanche Resistance Test Circuit
L
≥50Ω
10V
0V
50Ω
ATP404
VDD
No. A1405-2/4