CL10C080DB8NNNC Datasheet, PDF (9/21 Pages) Samsung semiconductor – General Multilayer Ceramic Capacitors

RELIABILTY TEST CONDITION
NO
ITEM
P E RFORMA NCE
TEST CONDIT ION
Appearance No mechanical damage shall occur.
Temperature
: 40±2 ℃
Characteristics
Capacitance Change
Relative humidity : 90~95 %RH
Class Ⅰ
Within ±5.0% or ±0.5㎊
whichever is larger
Duration time : 500 +12/-0 hr.
Capacitance
A(X5R)/
Leave the capacitor in ambient
Class
B(X7R)/
Within ±12.5%
condition for specified time* before
Ⅱ
X(X6S)
m e a sure m e n t.
CLASSⅠ : 24±2 Hr.
F(Y5V)
Within ±30%
CLASSⅡ : 24±2 Hr.
Capacitance ≥ 30㎊ : Q≥ 350
Humidity
13
( S te a dy
Q
CLASSⅠ
10≤ Capacitance <30㎊ : Q≥ 275 + 2.5×C
Capacitance < 10pF : Q≥ 200 + 10×C (C: Capacitance)
State)
1. Characteristic : A(X5R), 2. Characteristic : F(Y5V)
B(X7R)
0.05max (16V and over)
0.075max (25V and over)
Tanδ
CLASS Ⅱ
0.075max (10V)
0.075max
(6.3V except Table 1)
0.1max (16V, C<1.0㎌ )
0.125max(16V, C≥ 1.0㎌)
0.15max (10V)
0.125max*
0.195max (6.3V)
(refer to Table 1)
Insulation
Resistance
1,000 ㏁ or 50㏁ ·㎌ whichever is smaller.
Appearance No mechanical damage shall occur.
Characteristics
Capacitance Change
Class Ⅰ
Within ±5.0% or ±0.5㎊
whichever is larger
Capacitance
Class Ⅱ
A(X5R)/
B(X7R)/
X(X6S)
Within ±12.5%
Within ±12.5%
Within ±30%
Within ±30%
F(Y5V)
Within ±30%
Applied Voltage : rated voltage
Temperature : 40±2 ℃
Humidity : :90~95%RH
Duration Time : 500 +12/-0 Hr.
Charge/Discharge Current : 50㎃ max.
Perform the initial measurement according to
Note1 .
Perform the final measurement according to
Note2.
Moisture
14
Resistance
Q
(Class Ⅰ)
Capacitance ≥ 30㎊ : Q≥ 200
Capacitance <30㎊ : Q≥ 100 + 10/3×C (C: Capacitance)
Tanδ
(Class Ⅱ)
1. Characteristic : A(X5R),
B(X7R)
0.05max (16V and over)
0.075max (10V)
0.075max
(6.3V except Table 1)
0.125max*
(refer to Table 1)
2. Characteristic : F(Y5V)
0.075max (25V and over)
0.1max (16V, C<1.0㎌ )
0.125max(16V, C≥ 1.0㎌)
0.15max (10V)
0.195max (6.3V)
X(X6S) 0.11max (6.3V and below)
Insulation
500 ㏁ or 25㏁·㎌ whichever is smaller.
Resistance