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K4S560432E-TC Datasheet, PDF (8/14 Pages) Samsung semiconductor – 256Mb E-die SDRAM Specification | |||
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SDRAM 256Mb E-die (x4, x8, x16)
DC CHARACTERISTICS (x4, x8)
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C)
Parameter
Symbol
Test Condition
Operating current
(One bank active)
Precharge standby current in
power-down mode
Precharge standby current in
non power-down mode
Active standby current in
power-down mode
Active standby current in
non power-down mode
(One bank active)
Operating current
(Burst mode)
Burst length = 1
ICC1 tRC ⥠tRC(min)
IO = 0 mA
ICC2P CKE ⤠VIL(max), tCC = 10ns
ICC2PS CKE & CLK ⤠VIL(max), tCC = â
ICC2N
CKE ⥠VIH(min), CS ⥠VIH(min), tCC = 10ns
Input signals are changed one time during 20ns
ICC2NS
CKE ⥠VIH(min), CLK ⤠VIL(max), tCC = â
Input signals are stable
ICC3P CKE ⤠VIL(max), tCC = 10ns
ICC3PS CKE & CLK ⤠VIL(max), tCC = â
ICC3N
CKE ⥠VIH(min), CS ⥠VIH(min), tCC = 10ns
Input signals are changed one time during 20ns
ICC3NS
CKE ⥠VIH(min), CLK ⤠VIL(max), tCC = â
Input signals are stable
IO = 0 mA
Page burst
ICC4 4banks Activated.
tCCD = 2CLKs
Refresh current
ICC5 tRC ⥠tRC(min)
C
Self refresh current
ICC6 CKE ⤠0.2V
L
Notes : 1. Measured with outputs open.
2. Refresh period is 64ms.
3. K4S5604(08)32E-TC
4. K4S5604(08)32E-TL
5. Unless otherwise noticed, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ).
CMOS SDRAM
Version
75
80
2
2
20
10
6
6
25
25
100
180
3
1.5
Unit Note
mA
1
mA
mA
mA
mA
mA
mA
1
mA
2
mA
3
mA
4
Rev. 1.5 May 2004
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