RC2012J000CS Datasheet, PDF (6/19 Pages) Samsung semiconductor – Thick Film Chip Resistor ( General )

RELIABILITY TEST CONDITION
Jumper's reliability test data are only applied to General type resistor.
● ELECTRICAL CHARACTERISTIC
The electrical characteristic test should satisfy the test method, procedure, and standard.
If there is no special comment, Each test performs in standard state.
(temperature 20℃, humidity 65%RH, pressure 1023mbar)
item
DC resistance
Permissible deviation
Resistor
Jumper
DC resistance value
should be within the
specified resistance
tolerance.
50mΩ
Maximum
Test method
묤 Standard : JIS C 5201-1 4.5
묤 Test voltage : <Table 8>
묤 Applying time : within 5 seconds.
묤 Test board : <Fig 11>
<Table 8>
Range (Ω)
Voltage (V)
1≤ R < 10
10 ≤ R < 100
100 ≤ R < 1K
1K ≤ R < 10K
10K ≤ R < 100K
100K ≤ R < 1M
1M ≤ R < 10M
0.1
0.3
1.0
3.0
10.0
25.0
30.0
Temperature
Coefficient
of
Resistance
Short time
overload
(STOL)
Intermittent
overload
(IOL)
묤 Standard : JIS C 5201-1 4.8
묤 Temp. : 20℃ → -55℃ → 20℃ → 125℃ →
20℃
묤 Test board : <Fig 13>
<Table 9>
Range(Ω)
1 ≤ R < 10
ppm/℃
± 5 00
-
묤 Calculation :
TCR(ppm/℃) =
R− R0
R0
×
T
1
− T0
×
10⁶
10 ≤ R < 1M
±2 00
0 603 :± 2 50
T0 : 20 ± 2℃
1M ≤ R < 10M
±3 00
R0 : Resistance at T0 (Ω)
T : Test temperature ( -55, 125℃)
R : Resistance at T (Ω)
1. No mechanical
damage
2. ΔR should be
within ±(1%+0.1Ω)
50mΩ
Maximum
1. No mechanical
damage
2. ΔR should be
within ±(3%+0.1Ω)
50mΩ
Maximum
묤 Standard : JIS C 5201-1 4.13
묤 Test voltage : 2.5 times of rated voltage Max.
surge current at the Jumper.
묤 Applying time : 5 seconds
묤 Test board : <Fig 12>
묤 Standard : JIS C 5201-1 4.13
묤 Test voltage : 2.5 times of rated voltage Max.
surge current at the Jumper.
묤 Test method : 1 sec ON, 25 sec OFF
10 ,0 0 0^{+ 40 0}cycl e s
묤 Test board : <Fig 12>