CL31B475KAHNNNE Datasheet, PDF (10/21 Pages) Samsung semiconductor – General Multilayer Ceramic Capacitors

RELIABILTY TEST CONDITION
NO
ITEM
PERFORMANCE
TEST CONDITION
Appearance No mechanical damage shall occur.
Capacitance
Characteristics
Capacitance Change
Class Ⅰ
Within ±3% or ±0.3㎊,
Whichever is larger
A(X5R)/
Within ±12.5%
B(X7R)
Applied Voltage : 200%* of the rated voltage
Temperature : max. operating temperature
Duration Time : 1000 +48/-0 Hr.
Charge/Discharge Current : 50㎃ max.
* refer to table(3) : 150%/100% of the rated
voltage
Class Ⅱ
X(X6S)
F(Y5V)
Within ±25%
Within ±30%
Within ±30%
Perform the initial measurement according to
Note1 for Class Ⅱ
Q
(Class Ⅰ)
Capacitance ≥30㎊ : Q ≥ 350
10≤ Capacitance <30 ㎊ : Q ≥ 275 + 2.5×C
Capacitance < 10㎊ :Q ≥ 200 +10×C (C: Capacitance)
Perform the final measurement according to
Note2.
High
1. Characteristic : A(X5R), 2. Characteristic : F(Y5V)
15 Temperature
B(X7R)
Resistance
0.05max
0.075max
(16V and over)
(25V and over)
Tanδ
(Class Ⅱ)
0.075max (10V)
0.075max
(6.3V except Table 1)
0.125max*
0.1max(16V, C<1.0㎌)
0.125max(16V, C≥1.0㎌)
0.15max (10V)
0.195max (6.3V)
(refer to Table 1)
X(X6S) 0.11max (6.3V and below)
Insulation _{1,000 ㏁ or 50㏁·㎌ whichever is smaller.}
Resistance
Appearance No mechanical damage shall occur.
Characteristics
Class Ⅰ
Capacitance Change
Within ±2.5% or ±0.25㎊
Whichever is larger
Capacitance
Temperature
16
Cycle
Class
Ⅱ
A(X5R)/
Within ±7.5%
B(X7R)/
X(X6S) Within ±15%
F(Y5V) Within ±20%
Q
Within the specified initial value
(Class Ⅰ)
Tanδ
Within the specified initial value
(Class Ⅱ)
Insulation
Within the specified initial value
Resistance
Capacitor shall be subjected to 5 cycles.
Condition for 1 cycle :
Step
1
2
Temp.(℃)
Min. operating
temp.+0/-3
25
Time(min.)
30
2~3
Max. operating
3
30
temp.+3/-0
4
25
2~3
Leave the capacitor in ambient condition
for specified time* before measurement
* 24 ± 2 hours (Class Ⅰ)
24 ± 2 hours (Class Ⅱ)