CL21A475KAQNNNE Datasheet, PDF (1/2 Pages) Samsung semiconductor – SPECIFICATION

SPECIFICATION
• Supplier : Samsung electro-mechanics
• Product : Multi-layer Ceramic Capacitor
A. Samsung Part Number
• Samsung P/N : CL21A475KAQNNNE
• Description : CAP, 4.7㎌, 25V, ±10%, X5R, 0805
CL 21 A 475 K A Q N N N E
① ②③ ④ ⑤⑥⑦⑧⑨⑩⑪
① Series
② Size
Samsung Multi-layer Ceramic Capacitor
0805 (inch code)
L: 2.0 ± 0.15 mm
W: 1.25 ± 0.15 mm
③ Dielectric
④ Capacitance
⑤ Capacitance
tolerance
⑥ Rated Voltage
⑦ Thickness
X5R
4.7 ㎌
±10 %
25 V
1.25 ± 0.15 mm
⑧ Inner electrode
Termination
Plating
⑨ Product
⑩ Special
⑪ Packaging
Ni
Cu
Sn 100% (Pb Free)
Normal
Reserved for future use
Embossed Type, 7" reel
B. Samsung Reliablility Test and Judgement condition
Capacitance
Tan δ (DF)
Insulation
Resistance
Appearance
Withstanding
Voltage
Temperature
Characterisitcs
Adhesive Strength
of Termination
Bending Strength
Solderability
Performance
Test condition
Within specified tolerance
1㎑±10%
1.0±0.2Vrms
0.1 max.
10,000Mohm or 100Mohm⋅㎌
Rated Voltage 60~120 sec.
Whichever is Smaller
No abnormal exterior appearance
Microscope (×10)
No dielectric breakdown or
250% of the rated voltage
mechanical breakdown
X5R
(From -55℃ to 85℃, Capacitance change shoud be within ±15%)
No peeling shall be occur on the
500g⋅F, for 10±1 sec.
terminal electrode
Capacitance change : within ±12.5% Bending to the limit (1mm)
with 1.0mm/sec.
More than 75% of terminal surface
SnAg3.0Cu0.5 solder
is to be soldered newly
245±5℃, 3±0.3sec.
(preheating : 80~120℃ for 10~30sec.)
Resistance to
Soldering heat
Capacitance change : within ±7.5% Solder pot : 270±5℃, 10±1sec.
Tan δ, IR : initial spec.