BU76292AGUW Datasheet, PDF (4/5 Pages) Rohm – Silicon Monolithic integrated circuit

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◇Block diagram・External dimension
AVSS
AVDD
BIAS
LINEOUT
EVROUT
SPIN
BEEP IN
C5
A7
B6
A6 A5
MREG
ALC1
B5 BIAS
B4
A4
EVR
ALC2
C4
A3
SPNEG
B3
SPVSS
A2
SPVDD
B2
SPPOS
A1
G5 F3 G4 F4 G6 F6 G7 F7
LPF
CLAMP
1.8V
PLL C1
VREF
C3
RVSS
VREF
DAC
ADC
DET
2.75V
AL31
Digital
Filters
C2
LDO
D1
3.1V
D2
AL31
RESET
D3
2.75V
E2
BATT
G2
UNREG
AL31
RESETIN
RESETOUT
BATT
OSCIN
Audio
Interface
BATT
64Bit
Reg.
BATT
RTC
Control
OSC
G1
AL31
E1
F1
OSCOUT
CKOUT
BVSS
E5 E7 D7 D6 E6 F5 D5 C7 C6 B7 G3 E3
(note) Please the capacitors for VCC、BIAS、LNF、VREF、AL31 pins close to each.
Please the capacitors and X’tal for OSCIN, OSCOUT pins close to each.
Figure 1 Block diagram
Figure 2 External dimension （Unit：ｍｍ）
PKG : VBGA048W040
Drawing No：EX873-6001
◇Caution
（１） About absolute maximum rating
When the absolute maximum rating such as the applied voltage and the ranges of the operating temperature is exceeded, LSI might be destroyed.
Please apply neither voltage nor the temperature that exceeds the absolute maximum rating.
Please execute physical measures for safety such as fuse when it is thought to exceed the absolute maximum rating, and examine it so that
the condition to exceed the absolute maximum rating is not applied to LSI.
（２） About GND Voltage
In any state of operation must be the lowest voltage about the voltage of the terminal GND. Please actually confirm the voltage of each terminal
is not a voltage that is lower than the terminal GND including excessive phenomenon.
（３） About design of overheating malfunction preventive circuit
Please design overheating malfunction preventive circuit with an enough margin in consideration of a permissible loss in the state of using actually.
（４） About the short between terminals and the mounting by mistake
Please note the direction and the gap of position of LSI enough about LSI when you mount on the substrate. LSI might be destroyed when mounting
by mistake and energizing. Moreover, LSI might be destroyed when short-circuited by entering of the foreign substances between the terminal
and GND, between terminals, between the terminal and the power supply of LSI.
（５） About operation in strong electromagnetic field
Use in strong electromagnetic field has the possibility of malfunctioning and evaluate it enough, please.
（６） Please note not to be beyond the package permissible range, When SPVDD is set.
REV. B