TCFG_B_10 Datasheet, PDF (3/8 Pages) Rohm – Chip tantalum capacitors (Fail-safe open structure type)

TCFG Series B Case
Data Sheet
Characteristics
Item
Performance
Operating Temperature
−55 °C to +125 °C
Maximum operating temperature +85 °C
with no voltage derating
Rated Voltage (V.DC)
2.5 4 6.3 10 16 20 25
Category Voltage (V.DC) 1.6 2.5 4 6.3 10 13 16
Surge Voltage
3.2 5.0 8 13 20 26 32
DC leakage current
0.5μA or 0.01CV whichever is greater
(Shown in "Standard list")
Test conditions
(based on JIS C5101-1 and JIS C5101-3)
Voltage reduction when temperature exceeds +85°C
at 85°C
at 125°C
at 85°C
As per 4.9 JIS C 5101-1
As per 4.5.1 JIS C 5101-3
Voltage : Rated voltage for 1 min
Capacitance tolerance
Tangent of loss angle
(Df, tanδ)
Shall be satisfied allowance range.
±20%
Shall be satisfied the voltage on "Standard list"
As per 4.7 JIS C 5101-1
As per 4.5.2 JIS C 5101-3
Measuring frequency : 120±12Hz
Measuring voltage : 0.5Vrms, +1.5V.DC
Measuring circuit
: DC Equivalent series circuit
As per 4.8 JIS C 5101-1
As per 4.5.3 JIS C 5101-3
Measuring frequency : 120±12Hz
Measuring voltage : 0.5Vrms, +1.5V.DC
Measuring circuit
: DC Equivalent series circuit
Impedance
Shall be satisfied the voltage on "Standard list"
Resistance to _Appearance ^{There should be no significant abnormality.}
soldering heat
The indications should be clear.
L.C
TCFGB0G227M8R : Less than 150% of initial limit
TCFGB0J227M8R : Less than 150% of initial limit
TCFGB1A107M8R : Less than 150% of initial limit
TCFGB1E475M8R : Less than 150% of initial limit
Others
: Less than initial limit
ΔC / C
TCFGB0G227M8R : Within ±15% of initial value
TCFGB0J227M8R : Within ±15% of initial value
TCFGB1A107M8R : Within ±15% of initial value
TCFGB1E475M8R : Within ±10% of initial value
Others
: Within ± 5% of initial value
tanδ
3.3 to 33μF
: Less than initial limit
47 to 150μF
: Less than 150% of initial limit
TCFGB0E227M8R : Less than 200% of initial limit
TCFGB0G227M8R : Less than 150% of initial limit
TCFGB0J227M8R : Less than 150% of initial limit
TCFGB1A107M8R : Less than 150% of initial limit
TCFGB1C336M8R : Less than 150% of initial limit
Fail-Safe open unit actuation Within 320°C − 20s
Temperature
cycle
Moisture
resistance
Appearance There should be no significant abnormality.
L.C
ΔC / C
tanδ
TCFGB0G227M8R : Less than 150% of initial limit
TCFGB0J227M8R : Less than 200% of initial limit
TCFGB1A107M8R : Less than 200% of initial limit
TCFGB1E475M8R : Less than 150% of initial limit
Others
: Less than initial limit
TCFGB0E227M8R : Within ±15% of initial value
TCFGB0G227M8R : Within ±15% of initial value
TCFGB0J227M8R : Within ±20% of initial value
TCFGB1A107M8R : Within ±20% of initial value
Others
: Within ±10% of initial value
3.3 to 33μF
: Less than initial limit
47 to 150μF
: Less than 150% of initial limit
TCFGB0G227M8R : Less than 150% of initial limit
TCFGB0J227M8R : Less than 200% of initial limit
TCFGB1A107M8R : Less than 200% of initial limit
TCFGB1C336M8R : Less than 150% of initial limit
Appearance There should be no significant abnormality.
The indications should be clear.
L.C
TCFGB0G227M8R : Less than 150% of initial limit
TCFGB0J227M8R : Less than 200% of initial limit
TCFGB1A107M8R : Less than 200% of initial limit
TCFGB1E475M8R : Less than 150% of initial limit
Others
: Less than initial limit
ΔC / C
tanδ
TCFGB0G227M8R : Within ±15% of initial value
TCFGB0J227M8R : Within ±20% of initial value
TCFGB1A107M8R : Within ±20% of initial value
Others
: Within ±10% of initial value
3.3 to 33μF
: Less than initial limit
47 to 150μF
: Less than 150% of initial limit
TCFGB0G227M8R : Less than 150% of initial limit
TCFGB0J227M8R : Less than 200% of initial limit
TCFGB1A107M8R : Less than 200% of initial limit
TCFGB1C336M8R : Less than 150% of initial limit
As per 4.10 JIS C 5101-1
As per 4.5.4 JIS C 5101-3
Measuring frequency : 100±10kHz
Measuring voltage : 0.5Vrms or less
Measuring circuit : DC Equivalent series circuit
As per 4.14 JIS C 5101-1
As per 4.6 JIS C 5101-3
Dip in the solder bath
Solder temp : 260±5°C
Duration
: 5±0.5s
Repetition : 1
After the specimens, leave it at room temperature
for over 24h and then measure the sample.
Dip in the solder bath
Solder temp : 320±5°C
As per 4.16 JIS C 5101-1
As per 4.10 JIS C 5101-3
Repetition : 5 cycles (1 cycle : steps 1 to 4)
without discontinuation.
Step
1
2
3
4
Temp.
−55 +− 3°C
Room temp.
125 ^+− 2°C
Room temp.
Time
30 +−3min
3min. or less
30 +−3min
3min. or less
After the specimens, leave it at room temperature
for over 24h and then measure the sample.
As per 4.22 JIS C 5101-1
As per 4.12 JIS C 5101-3
After leaving the sample under such atmospheric
condition that the temperature and humidity are
60±2°C and 90 to 95%RH, respectively, for
500±12h level it at room temperature for over 24h
and then measure the sample.
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2010.01 - Rev.G