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BU2872AK Datasheet, PDF (3/4 Pages) Rohm – FL tube driver
Standard ICs
BU2872AK
•Electrical characteristics (unless otherwise noted, Ta = 25°C, VDD = 5V, VSS = 0V, VDD-VEE = 30V)
Parameter
Symbol Min. Typ. Max. Unit
Conditions
Measurement circuit
Supply current
IDD
—
—
5
mA Pin 44 external 1000 pF, when oscillated
Fig.1
Input threshold voltage
VIN
1.5
—
3.5
V Pins 1 to 4, 6, 8, 9 to 13
Fig.5
Input current
IIN
—
—
10
µA Pins 1 to 4, 6, 8, 9 to 13
Fig.2
Oscillation frequency
Segment output current
Grid output current
FOSC
130
200
300
kHz Pin 44 external 1000 pF
Fig.4
IOseg
7
—
—
mA Pins 15 to 26, 28 to 31 VO = VDD – 2V ∗2
Fig.2
IOgrd
20
—
—
mA Pins 26, 28 to 37 VO = VDD – 2V ∗2
Fig.2
Off level leakage current
IOFF
—
—
10
µA Pins 15 to 26, 28 to 37 VO = VDD – VEE
Fig.2
Output pull-down resistance RD
15
31
60
kΩ Pins 15 to 26, 28 to 37
Fig.2
LED output high level voltage VOH
4.0
—
—
V Pins 39 to 42 IO = 1mA
Fig.3
LED output low level voltage VOL
—
—
1.0
V Pins 39 to 42 IO = – 10mA
Fig.3
〈Serial transfer〉
Input data hold
TSH
0.16
—
—
µs
—
—
Input data setup
TSS
0.16
—
—
µs
—
—
Output data delay
TD
—
—
0.3
µs
—
—
Input clock cycle
TSCYC
0.5
—
—
µs
—
—
Input clock "H" width
T
40
—
60
% Input clock cycle at minimum value
—
∗2 Each of the high withstanding voltage output pins, pins 26 and 28 to 31, outputs the segment output current when set to the segment output and
the grid current when set to the grid output.
•Measurement circuits
A
VEE
VDD
1000p
OSC
VSS
VEE
VDD
n = Test pin
nA
VSS
V
VEE
VDD
n = Test pin
n
V
I
VSS
Fig.1
Fig.2
Fig.3
1000p
VEE
OSC
VDD
G1
VSS
Monitor
VEE
VDD
VSS
Fig.4
Fig.5
3