R1114 Datasheet, PDF (9/23 Pages) RICOH electronics devices division – LOW NOISE 150mA LDO REGULATOR

TEST CIRCUITS
R1114x
CE
CE
VDD
IN
1.0μF
R1114xxx1B/D
SERIES
GND
VOUT
OUT
IOUT
1.0μF
VDD
IN
ISS
1.0μF
R1114xxx1B/D
SERIES
GND
VOUT
OUT
1.0μF
Fig.1 Standard test Circuit
Fig.2 Supply Current Test Circuit
CE
CE
VDD
IN
P.G.
R1114xxx1B/D
SERIES
GND
VOUT
OUT
IOUT
1.0μF
VDD
IN
1.0 F
R1114xxx1B/D
SERIES
GND
VOUT
OUT
1.0μF
I1 I2
Fig.3 Ripple Rejection, Line Transient
Response Test Circuit
Fig.4 Load Transient Response Test Circuit
9