R1152N Datasheet, PDF (7/21 Pages) RICOH electronics devices division – High Input Voltage Tolerant Boost Voltage Regulator

TEST CIRCUITS
VIN CIN
VIN
EXT
CE
VOUT
GND
PNP Tr
OUT
COUT
Fig.1 Standard test Circuit CIN=0.1µF, COUT=10µF
R1152N
ISS
VIN
EXT
CE
VIN
VOUT
GND
VOUT
Fig.2 Supply Current Test Circuit
P.G.
VIN
EXT
CE
VOUT
GND
PNP Tr
IOUT _OUT
COUT
VIN CIN
VIN
EXT
PNP Tr
CE
VOUT
GND
OUT
COUT
I1
I2
Fig.3 Ripple Rejection, Line Transient Response
Test Circuit COUT=10µF
TYPICAL APPLICATIONS
Fig.4 Load Transient Response Test Circuit
CIN=0.1µF, COUT=10µF
IN
CIN
IN
VIN
EXT
PNP Tr
CE
VOUT
OUT
CIN
GND
COUT
VIN
EXT
CE
VOUT
GND
PNP Tr
OUT
COUT
Fixed Type Output
(External Components)
CIN=0.1µF, COUT=10µF
Adjustable Output
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