R1126N151B Datasheet, PDF (6/23 Pages) RICOH electronics devices division – LOW NOISE 150mA LDO REGULATOR

R1126N
TEST CIRCUITS
C1
VDD
VOUT
R1126N
Series
CE GND
C2 V VOUT ↓ IOUT
C1=Ceramic 1.0µF
C2=Ceramic 1.0µF
Fig.1 Standard test Circuit
A _ISS
C1
VDD
VOUT
R1126N
Series
CE GND
C2
C1=Ceramic 1.0µF
C2=Ceramic 1.0µF
Fig.2 Supply Current Test Circuit
Pulse
Generator
VDD
VOUT
R1126N
Series
CE GND
C2 ↓ IOUT
C2=Ceramic 1.0µF
Fig.3 Ripple Rejection, Line Transient Response Test Circuit
6