RT9014 Datasheet, PDF (6/12 Pages) Richtek Technology Corporation – Ultra Low Noise 300mA Dual LDO Regulator with POR, NMOS Driver and Requiring No Bypass Capacitor

RT9014/A
Preliminary
Pa rame te r
PSRR
I_LOAD = 10mA
PSRR
ILOAD = 150mA
Power Good
Sym bol
Test Conditions
f =100Hz
PSRR f =1kHz
f =10kHz
f =100Hz
PSRR f =1kHz
f =10kHz
Min Typ Max Units
--
65
--
dB
--
60
--
dB
--
50
--
dB
--
65
--
dB
--
50
--
dB
--
50
--
dB
Reset Threshold
POR Output Logic Low Voltage
POR Leakage Current
Set pin current source
Set pin threshold
V_THL
V_THH
V_{O L}
I_POR
Low Threshold, % of nominal
V_OUT2 (Flag On)
High Threshold, % of nominal
V_OUT2 (Flag Off)
I_LOW = 250uA
Flag Off
V_SET = 0
POR = high
85
90
93
%
92
95
98
%
-- 0.02 0.1
V
-1 0.01 1
μA
0.60 1.25 1.70 μA
--
1.4
--
V
DRV output
Voltage Low
Leakage current
SW input current
SW input voltage
I_DRV = 150mA
--
0.2 0.5
V
I_DRV = 0mA, V_DRV = 5V, SW = 0V
-1
0.01
1
μA
V_IL < 0.6V(DRV Shutdown)
-1 0.01 1
μA
V_IH > 2.5V(DRV Enable)
-1 0.01 1
μA
V IL
Logic Low
--
--
0. 4
V
V _IH
Logic High
1.5
--
--
V
Note 1. Stresses listed as the above "Absolute Maximum Ratings" may cause permanent damage to the device. These are for
stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended
periods may remain possibility to affect device reliability.
Note 2. Devices are ESD sensitive. Handling precaution recommended.
Note 3. The device is not guaranteed to function outside its operating conditions.
Note 4. θJA is measured in the natural convection at TA = 25°C on a low effective thermal conductivity test board of
JEDEC 51-3 thermal measurement standard.
Note 5. The dropout voltage is defined as VIN -VOUT, which is measured when VOUT is VOUT(NORMAL) − 100mV.
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6
DS9014/A-08 August 2007