RP1104 Datasheet, PDF (1/2 Pages) RF Monolithics, Inc – 824.25 MHz SAW Resonator

®
• Ideal for 824 MHz Oscillators
• Nominal Insertion Phase Shift of 180° at Resonance
• Quartz Stability
• Rugged, Hermetic, Low-Profile TO39 Case
• Complies with Directive 2002/95/EC (RoHS) Pb
The RP1104 is a two-port, 180° surface-acoustic-wave (SAW) resonator in a low-profile TO39 case. It pro-
vides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency oscillators operating at or
near 824.05 MHz. The nominal resonator frequency is higher than the nominal oscillator frequency to allow
for production frequency tuning. This SAW is designed specifically for stabilization of the second LO of CATV
convertors with channel 13 outputs for use in Taipei. In this application, the oscillator must be a modified-
Colpitts design with the SAW connected to simulate a one-port SAW.
RP1104
824.25 MHz
SAW
Resonator
Absolute Maximum Ratings
Rating
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Any Two Pins (Observe ESD Precautions)
Case Temperature
Value
+5
±30
-40 to +85
Units
dBm
VDC
°C
TO39-3 Case
Electrical Characteristics
Center Frequency
Characteristic
Absolute Frequency
Tolerance from 824.250 MHz
Insertion Loss
Quality Factor
Unloaded Q
50 Ω Loaded Q
Temperature Stability Turnover Temperature
Turnover Frequency
Frequency Temp. Coefficient
Frequency Aging
Absolute Value during First Year
DC Insulation Resistance between Any Two Pins
RF Equivalent RLC
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
Lid Symbolization (in addition to Lot and/or Date Codes)
Sym
f_C
∆f_C
IL
Q_U
Q_L
T_O
f_O
FTC
|f_A|
R_M
L_M
C_M
C_O
Notes
2, 3, 4, 5,
2, 5, 6
5, 6, 7
6, 7, 8
6
5
5, 7, 9
5, 6, 9
Minimum
824.100
Typical
9.0
7,100
4,500
66
81
f_C+96
0.037
≤ 10
1.0
182
248.091
0.150284
1.2
1.5
RFM P1104
Maximum
824.400
±150
9.5
Units
MHz
kHz
dB
96
°C
kHz
ppm/°C²
ppm/yr
MΩ
199
Ω
µH
fF
1.8
pF
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Frequency aging is the change in f_C with time and is specified at +65°C or less. Aging may exceed the specification for prolonged temperatures
above +65°C. Typically, aging is greatest the first year after manufacture, decreasing significantly in subsequent years.
2. The frequency f_C is the frequency of minimum IL with the resonator in the specified test fixture in a 50 Ω test system with VSWR ≤ 1.2:1. Typically,
f_OSCILLATOR or f_TRANSMITTER is less than the resonator f_C.
3. One or more of the following United States patents apply: 4,454,488; 4,616,197.
4. Typically, equipment utilizing this device requires emissions testing and government approval, which is the responsibility of the equipment manufac-
turer.
5. Unless noted otherwise, case temperature T_C = +25°C± 5°C
6. The design, manufacturing process, and specifications of this device are subject to change without notice.
7. Derived mathematically from one or more of the following directly measured parameters: f_C, IL, 3 dB bandwidth, f_C versus T_C, and C_O.
8. Turnover temperature, T_O, is the temperature of maximum (or turnover) frequency, f_O. The nominal frequency at any case temperature, T_C, may be
calculated from: f = f_O [1 - FTC (T_O - T_C)²]. Typically, oscillator T_O is 20° less than the specified resonator T_O.
9. This equivalent RLC model approximates resonator performance near the resonant frequency and is provided for reference only. The capacitance
C_O is the measured static (nonmotional) capacitance between either pin 1 and ground or pin 2 and ground. The measurement includes case parasitic
capacitance.
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RP1104-110499
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