HD74LV20A_15 Datasheet, PDF (8/11 Pages) Renesas Technology Corp – Dual 4-input Positive NAND Gates

HD74LV20A
Test Circuit
Measurement point
C_L^*
Note: CL includes the probe and jig capacitance.
• Waveform − 1
t_r
t_f
90%
90%
V_CC
Input
50% V_CC
50% V_CC
10%
10%
0V
t_PLH
t_PHL
In phase output
t_PHL
50% V_CC
50% V_CC
t_PLH
V_OH
V_OL
Out of phase output
V_OH
50% V_CC
50% V_CC
V_OL
Notes:1. Input waveform: PRR ≤ 1 MHz, Zo = 50 Ω, t_r ≤ 3 ns, t_f ≤ 3 ns
2. The output are measured one at a time with one transition per measurement.
Rev.3.00 May 31, 2004 page 6 of 8