English
Language : 

HN58X24512I Datasheet, PDF (5/19 Pages) Hitachi Semiconductor – Two-wire serial interface 512k EEPROM (64-kword ´ 8-bit)
HN58X24512I
AC Characteristics (Ta = −40 to +85°C, VCC = 1.8 to 5.5 V)
Test Conditions
• Input pules levels:
 VIL = 0.2 × VCC
 VIH = 0.8 × VCC
• Input rise and fall time: ≤ 20 ns
• Input and output timing reference levels: 0.5 × VCC
• Output load: TTL Gate + 100 pF
VCC = 1.8 to 5.5 V VCC = 2.5 to 5.5 V
Parameter
Symbol Min
Max
Min
Max Unit
Clock frequency
fSCL

400

1000 kHz
Clock pulse width low
tLOW
1200 
600

ns
Clock pulse width high
tHIGH
600

400

ns
Noise suppression time
tI

50

50
ns
Access time
tAA
100
900
100
550
ns
Bus free time for next mode
tBUF
1200 
500

ns
Start hold time
tHD.STA
600

250

ns
Start setup time
tSU.STA
600

250

ns
Data in hold time
tHD.DAT
0

0

ns
Data in setup time
tSU.DAT
100

100

ns
Input rise time
tR

300

300
ns
Input fall time
tF

300

100
ns
Stop setup time
tSU.STO
600

250

ns
Data out hold time
tDH
50

50

ns
Write cycle time
tWC

15

10
ms
Notes: 1. This parameter is sampled and not 100% tested.
2. tWC is the time from a stop condition to the end of internally controlled write cycle.
Notes
1
1
1
2
Rev.2.00, Dec.13.2004, page 5 of 17