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HD74HCT1G32 Datasheet, PDF (4/7 Pages) Renesas Technology Corp – High Speed CMOS two input OR gate Using Silicon Gate CMOS Process
HD74HCT1G32
Electrical Characteristics
Item
VCC
Symbol (V)
Ta = 25°C
Min Typ
Input voltage VIH
4.5 to 2.0 —
5.5
VIL
4.5 to — —
5.5
Output voltage VOH
4.5 4.4 4.5
4.5 4.18 4.31
VOL
4.5 — 0.0
4.5 — 0.17
Input current IIN
Operating
ICC
current
5.5 — —
5.5 — —
Quiescent
ICCT
5.5 —
—
supply current
Max
—
0.8
—
—
0.1
0.26
±0.1
1.0
2.0
Ta = –40 to 85°C
Min Max Unit Test Conditions
2.0 —
V
— 0.8
4.4 —
4.13 —
— 0.1
— 0.33
— ±1.0
— 10.0
V VIN =
IOH = –20 µA
VIH or VIL IOH = –2 mA
IOL = 20 µA
IOL = 2 mA
µA VIN = VCC or GND
µA VIN = VCC or GND
— 2.9 mA One input VIN = 2.4 V,
other input VCC or GND
Switching Characteristics
Ta = 25°C
Item
Symbol Min
Typ
Output rise / fall time tTLH
—
5
tTHL
Propagation delay time tPLH
—
7.8
tPHL
—
9.6
(CL = 15 pF, tr = tf = 6 ns, VCC = 5 V)
Max
Unit Test Conditions
10
ns
Test circuit
12
ns
Test circuit
17
Ta = 25°C
Ta = –40 to 85°C
Item
Symbol VCC Min Typ Max Min Max Unit Test Conditions
Output rise / fall time tTLH
tTHL
4.5 — 14 25 —
31
ns Test circuit
Propagation delay time tPLH
4.5 — 10.5 16 —
20
ns Test circuit
tPHL
4.5 — 16.0 27 —
31
Input capacitance
CIN
— — 2.5 5 —
5
pF
Equivalent capacitance CPD
— — 10 — —
—
pF
(CL = 50 pF, tr = tf = 6 ns)
Note: CPD is equivalent capacitance inside of the IC calculated from the operating current without load (see
test circuit). The average operating current without load is calculated according to the expression
below.
ICC (opr) = CPD • VCC • fIN + ICC
Rev.5.00, Jan.29.2004, page 4 of 6