R1Q3A3636B Datasheet, PDF (19/27 Pages) Renesas Technology Corp – 36-Mbit QDR™II SRAM 4-word Burst

R1Q3A3636B/R1Q3A3618B/R1Q3A3609B
TAP AC Test Conditions
Parameter
Temperature
Input timing measurement reference levels
Input pulse levels
Input rise/fall time
Output timing measurement reference levels
Test load termination supply voltage (V_TT)
Output load
Symbol
Ta
V_REF
V_IL, V_IH
tr, tf
Conditions
0 ≤ Ta ≤ +70
0.9
0 to 1.8
≤ 1.0
0.9
0.9
See figures
Input waveform
1.8 V
0V
0.9 V
Test points
0.9 V
Output waveform
0.9 V
Test points
0.9 V
Unit
Notes
°C
V
V
ns
V
V
Output load condition
DUT
TDO
Z₀ = 50 Ω
External Load at Test
V_TT = 0.9 V
50 Ω
20 pF
REJ03C0342-0003 Rev.0.03 Apr.11, 2008
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