6N137 Datasheet, PDF (4/10 Pages) Toshiba Semiconductor – IRED & PHOTO IC (DEGITAL LOGIC ISOLATION, TELE-COMMUNICATION, ANALOG DATA EQUIPMENT CONTROL)

HIGH SPEED-10 MBit/s
LOGIC GATE OPTOCOUPLERS
SINGLE-CHANNEL
6N137
HCPL-2601
HCPL-2611
DUAL-CHANNEL
HCPL-2630
HCPL-2631
TRANSFER CHARACTERISTICS (T_A = -40°C to +85°C Unless otherwise specified.)
DC Characteristics
Test Conditions Symbol
Min
Typ**
Max
Unit
High Level Output Current
(V_CC = 5.5 V, V_O = 5.5 V)
(I_F = 250 µA, V_E = 2.0 V) (Note 2)
I_OH
Low Level Output Current
(V_CC = 5.5 V, I_F = 5 mA)
(V_E = 2.0 V, I_CL = 13 mA) (Note 2)
V_OL
Input Threshold Current
(V_CC = 5.5 V, V_O = 0.6 V,
V_E = 2.0 V, I_OL = 13 mA)
I_FT
100
µA
.35
.06
V
3
5
mA
ISOLATION CHARACTERISTICS (T_A = -40°C to +85°C Unless otherwise specified.)
Characteristics
Test Conditions Symbol
Min
Typ**
Max
Unit
Input-Output
(Relative humidity = 45%)
Insulation Leakage Current
(T_A = 25°C, t = 5 s)
(V_I-O = 3000 VDC)
I_I-O
(Note 12)
1.0*
µA
Withstand Insulation Test Voltage
(RH < 50%, T_A = 25°C)
(Note 12) ( t = 1 min.)
V_ISO
2500
V_RMS
Resistance (Input to Output)
(V_I-O = 500 V) (Note 12)
R_I-O
10¹²
!
Capacitance (Input to Output)
(f = 1 MHz) (Note 12)
C_I-O
0.6
pF
** All typical values are at V_CC = 5 V, T_A = 25°C
NOTES
1. The V_CC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum
capacitor with good high frequency characteristic and should be connected as close as possible to the package V_CC and GND pins
of each device.
2. Each channel.
3. Enable Input - No pull up resistor required as the device has an internal pull up resistor.
4. t_PLH - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5 V
level on the LOW to HIGH transition of the output voltage pulse.
5. t_PHL - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5 V
level on the HIGH to LOW transition of the output voltage pulse.
6. t_r - Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. t_f - Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. t_ELH - Enable input propagation delay is measured from the 1.5 V level on the HIGH to LOW transition of the input voltage pulse
to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.
9. t_EHL - Enable input propagation delay is measured from the 1.5 V level on the LOW to HIGH transition of the input voltage pulse
to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.
10. CM_H - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state
(i.e., V_OUT > 2.0 V). Measured in volts per microsecond (V/µs).
11. CM_L - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low output state
(i.e., V_OUT < 0.8 V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.
8/10/99 200002A