W717 Datasheet, PDF (4/5 Pages) Pulse A Technitrol Company – EMI Suppression for CAN-Bus Networks 2-Line Common Mode Chokes

Automotive Chip Choke^®
EMI Suppression for CAN-Bus Networks
2-Line Common Mode Chokes
Reliability Test
Item
1. High Temperature Exposure
2. Temperature Cycling
3. Biased Humidity Test
4. Operational Life
5. External Visual
6. Physical Dimensions
7. Resistance to solvents
8. Vibration Test
9. Resistance to Soldering Heat Test
10. Rated Current
11. Temperature Rise
12. Over load
13. Solderability Test
14. Electrical Characterization
15. Withstanding Voltage Test
16. Drop
17. Terminal Strength Test
Reference documents
MIL-STD-202 Method 108
JESD22 Method JA-104
MIL-STD-202 Method 103
MIL-PRF-27
MIL-STD-883 Method 2009
JESD22 Method JB-100
MIL-STD-202 Method 215
MIL-STD-202 Method 204
MIL-STD-202 Method 210
MIL-STD-202 Method 330
MIL-PRF-27
MIL-PRF-27
J-STD-002
User Spec.
MIL-STD-202 Method 201
JESD22-B111
JIS-C-6429
Test Condition
Test Specification
1. Temperature: 125�C
2. Time: 96 hours
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
1. Temperature: 40�C~125�C
2. Number of cycles: 96 cycle
3.Dwell time: 30 minutes
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
1. Temperature: 85±5�C
2. Time: 96 hours
3. Humidity: 85±5% RH
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
1. Temperature: 125�C
2. Time: 96 hours
3. Apply rated current
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
Inspect product construction, marking and
workmanship
Per product specification standard
Verify physical dimensions to the applicable product Per product specification standard
detail specification
Immerse into solvent for 3±0.5 minutes & brush 10 1. No body change in appearance
times for their cycles.
2. No marking blurred.
3. Inductance shall not change more than ±30%
1. Frequency and Amplified: 10-2000-10 Hz, 1.5mm
2. Direction: X, Y, Z
1. No mechanical and electrical damage
3. Test duration: 2 hours for each direction, 6 hours 2. Inductance shall not change more than ±30%
in total
1. Temperature: 250±5�C
2. Time: (temp.≥217�C) 60~150 Second
3. IR reflow times: 3 times
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
Apply rated current for 5 seconds.
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
Apply rated current for 10 minutes.
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
Apply twice as rated current for 5 minutes.
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
1. Bakeing in pre-testing: 155±5�C / 16Hours±30min.
2. Peak temperature: 240±5�C
The terminal shall be at least 95% covered with fresh
3. Time: (temp.≥217�C) 60~150 Second
solder.
4. IR reflow times: 1 time
1. Operating temperature:-40�C~125�C
2. Room Temperature: 25�C
1. No mechanical and electrical damage
2. Inductance shall not change more than ±30%
1. DV: 500V
2. Time: 1 minute
1. During the test no breakdown.
2. The characteristic is normal after test.
Package & Drop down from 1m. In 1 angle 1 ridge 1. No case deformation or change in appearance.
& 2 surfaces orientation
2. Inductance shall not change more than ±30%
1. Apply push force to samples mounted on PCB. After test, inductors shall be on mechanical damge.
2. Force of 1.8 kg for 60±1 seconds.
4
pulseelectronics.com
W717.B (11/15)