PO100HSTL179A_14 Datasheet, PDF (3/7 Pages) Potato Semiconductor Corporation – High Frequency Noise Canncellation Translator

PO100HSTL179A
www.potatosemi.com
Differential LVDS/LVPECL/HSTL to LVTTL Translator
& LVTTL/LVCMOS to Differential HSTL Translator
High Frequency Noise Canncellation Translator
Power Supply Characteristics
Symbol
Description
Test Conditions (1)
Min Typ Max Unit
IccQ ^{Quiescent Power Supply Current}
Vcc=Max, Vin=Vcc or GND _{- 0.1 30 uA}
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, 25•C ambient.
3. This parameter is guaranteed but not tested.
4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
Receiver Switching Characteristics
Symbol
Description
Test Conditions (1)
Max
tPD
tr/tf
tsk(o)
tsk(pp)
fmax
fmax
Propagation Delay D to Output pair
Rise/Fall Time
Output Pin to Pin Skew (Same Package)
Output Skew (Different Package)
Input Frequency
Input Frequency
CL = 15pF
0.8V – 2.0V
CL = 15pF, 125MHz
CL = 15pF, 125MHz
CL =15pF
CL = 5pF
1.8
0.8
150
300
4250
8300
fmax Input Frequency
CL = 2pF
14000
Notes:
1. See test circuits and waveforms.
2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested.
3. Airflow of 1m/s is recommended for frequencies above 133MHz
Unit
ns
ns
ps
ps
MHz
MHz
MHz
Test Circuit
Pulse V+
Generator V-
Vcc
50Ohm
V+
D.U.T
V-
50Ohm
15pF
to
2pF
Potato Semiconductor Corporation
3
01/01/10