PO100HSTL179A Datasheet, PDF (3/8 Pages) Potato Semiconductor Corporation – Differential LVDS/LVPECL/HSTL to LVTTL Translator LVTTL/LVCMOS to Differential HSTL Translator

PO100HSTL179A
Differential LVDS/LVPECL/HSTL to LVTTL Translator
LVTTL/LVCMOS to Differential HSTL Translator
04/26/09
Power Supply Characteristics
Symbol
Description
Test Conditions (1)
Min Typ Max Unit
IccQ ^{Quiescent Power Supply Current}
Vcc=Max, Vin=Vcc or GND _{- 0.1 30 uA}
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, 25°C ambient.
3. This parameter is guaranteed but not tested.
4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
Receiver Switching Characteristics
Symbol
Description
Test Conditions (1)
M ax
tPD
tr/tf
tsk(o)
tsk(pp)
fmax
fmax
Propagation Delay D to Output pair
Rise/Fall Time
Output Pin to Pin Skew (Same Package)
Output Skew (Different Package)
Input Frequency
Input Frequency
CL = 15pF
0.8V – 2.0V
CL = 15pF, 125MHz
CL = 15pF, 125MHz
CL =15pF
CL = 5pF
1.8
0.8
150
300
4250
8300
fmax Input Frequency
CL = 2pF
14000
Notes:
1. See test circuits and waveforms.
2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested.
3. Airflow of 1m/s is recommended for frequencies above 133MHz
Unit
ns
ns
ps
ps
MHz
MHz
MHz
Test Circuit
Pulse V+
Generator V-
Vcc
50Ω
V+
D.U.T
V-
50Ω
15pF
to
2pF
3
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