PO49FCT1816 Datasheet, PDF (2/6 Pages) Potato Semiconductor Corporation – 4X1:4 CMOS Clock Buffered Driver

PO49FCT1816
4X1:4 CMOS Clock Buffered Driver
500MHz TTL/CMOS Potato Chip
11/22/05
Maximum Ratings
Description
Storage Temperature
Operation Temperature
Operation Voltage
Input Voltage
Output Voltage
Max
-65 to 150
-40 to 85
-0.5 to +4.6
-0.5 to Vcc+0.5
-0.5 to Vcc+0.5
Unit
°C
°C
V
V
V
Note:
stresses greater than listed under
Maximum Ratings may cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
DC Electrical Characteristics
Symbol
Description
Test Conditions
VOH
VOL
VIH
VIL
IIH
IIL
VIK
Output High voltage Vcc=3V Vin=VIH or VIL, IOH= -24mA
Output Low voltage Vcc=3V Vin=VIH or VIL, IOH=24mA
Input High voltage Guaranteed Logic HIGH Level (Input Pin)
Input Low voltage Guaranteed Logic LOW Level (Input Pin)
Input High current Vcc = 3.6V and Vin = 3.6V
Input Low current Vcc = 3.6V and Vin = 0V
Clamp diode voltage Vcc = Min. And IIN = -18mA
Min Typ Max Unit
2.46
-V
-
0.44 V
2 - Vcc V
-0.5 - 0.8 V
- - 1 uA
- - -1 uA
- -0.7 -1.2 V
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, 25 °C ambient.
3. This parameter is guaranteed but not tested.
4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
5. VoH = Vcc – 0.6V at rated current
2
Copyright © 2005, Potato Semiconductor Corporation