UM10486 Datasheet, PDF (9/18 Pages) NXP Semiconductors – UBA2015P reference design 120 V (AC)

NXP Semiconductors
UM10486
UBA2015P reference design 120 V (AC)
4.2.4 ElectroMagnetic Interference (EMI) - conducted emission tests
The board with lamp complies with FCC-15 quasi-peak and average measurements, no
metal shielding required for acceptable EMI performance. The ballast was tested on a
reference luminaire with two TL5HE35W lamps.
Fig 8. Photograph of the EMI conducted emission measurement setup
019aac300
UM10486
User manual
All information provided in this document is subject to legal disclaimers.
Rev. 1.1 — 8 September 2011
© NXP B.V. 2011. All rights reserved.
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