74LVC827A_15 Datasheet, PDF (9/16 Pages) NXP Semiconductors – 10-bit buffer/line driver with 5 V tolerant inputs/outputs; 3-state

NXP Semiconductors
74LVC827A
10-bit buffer/line driver with 5 V tolerant inputs/outputs; 3-state
t_W
V_{I 90 %}
negative
pulse
V_M
10 %
0V
t_f
V_I
positive
pulse
t_r
90 %
V_M
10 %
0V
t_W
V_I
G
V_CC
V_O
DUT
RT
V_M
t_r
t_f
V_M
V_EXT
RL
CL
RL
001aae331
Fig 6.
Test data is given in Table 9.
Definitions for test circuit:
R_L = Load resistance.
C_L = Load capacitance including jig and probe capacitance.
R_T = Termination resistance should be equal to output impedance Z_o of the pulse generator.
V_EXT = External voltage for measuring switching times.
Test circuit for measuring switching times
Table 9. Test data
Supply voltage
1.2 V
1.65 V to 1.95 V
2.3 V to 2.7 V
2.7 V
3.0 V to 3.6 V
Input
V_I
V_CC
V_CC
V_CC
2.7 V
2.7 V
t_r, t_f
 2 ns
 2 ns
 2 ns
 2.5 ns
 2.5 ns
Load
C_L
30 pF
30 pF
30 pF
50 pF
50 pF
R_L
1 k
1 k
500 
500 
500 
V_EXT
t_PLH, t_PHL
open
open
open
open
open
t_PLZ, t_PZL
2  V_CC
2  V_CC
2  V_CC
2  V_CC
2  V_CC
t_PHZ, t_PZH
GND
GND
GND
GND
GND
74LVC827A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 25 November 2011
© NXP B.V. 2011. All rights reserved.
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