74HC_HCT4852_15 Datasheet, PDF (9/20 Pages) NXP Semiconductors – Dual 4-channel analog multiplexer/demultiplexer with injection-current effect control

NXP Semiconductors
74HC4852; 74HCT4852
4-channel analog MUX/DEMUX with injection-current effect control
V_IH
E
I_S ^nYn
VI
V_CC
nZ _IS
GND
VO
001aag098
Fig 6. Test circuit for measuring OFF-state leakage
current
V_CC
I_S ^{nYn selected channel(1)}
VI
nZ _n.c.
V_IL
VO
E
nYn
any disabled channel
GND
001aag099
(1) Channel is selected by S0 and S1.
Fig 7. Test circuit for measuring ON-state leakage
current
V_IL
E
nYn
VI
VSW
V
V_CC
nZ
GND
R_ON = V_SW / I_SW.
ISW
001aag100
Fig 8. Test circuit for measuring ON resistance
V_I(1)
ISW
V_CC
any disabled channel
nYn
nZ
V_IL
V_I(2)
RS
E
nYn
selected channel⁽¹⁾
GND
VI
V_O
001aag101
(1) Channel is selected by S0 and S1.
V_I(1) < GND or V_I(1) > V_CC.
GND < V_I(2) < V_CC.
Fig 9. Test circuit for injection current coupling
74HC_HCT4852_3
Product data sheet
Rev. 03 — 2 September 2008
© NXP B.V. 2008. All rights reserved.
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