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74F8960 Datasheet, PDF (8/11 Pages) NXP Semiconductors – Octal latched bidirectional Futurebus transceivers 3-State open-collector | |||
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Philips Semiconductors FAST Products
Octal latched bidirectional Futurebus transceivers
(3-State + open-collector)
Product specification
74F8960/74F8961
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS1
LIMITS
UNIT
TYP.
MIN. 2 MAX.
IOH
Highâlevel output current
IOFF
Powerâoff output current
VOH
High-level output voltage
VOL
Low-level output voltage
VIK
Input clamp voltage
II
Input current at
maximum input voltage
IIH
Highâlevel input current
IIL
Lowâlevel input current
IOZH + IIH
Offâstate output current,
highâlevel current applied
B0 â B7
B0 â B7
A0 â A74
A0 â A74
B0 â B78
A0 â A7
Except A0 â A7
OEBn, OEA, LE
A0âA7, B0 â B7
OEBn, OEA, LE
B0âB7
OEBn, OEA, LE
B0 â B7
VCC = MAX, VIL = MAX, VIH = MIN, VOH = 2.1V
VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 2.1V
VCC = MIN,
IOH = â3mA, VX =VCC
VIL = MAX, VIH = MIN
IOH = â4mA,
VX =3.13V and 3.47V
VCC = MIN,
IOL = 20mA, VX = VCC
VIL = MAX
IOL = 100mA
VIH = MIN
IOL = 4mA
VCC = MIN, II = IIK
VCC = MIN, II = IIK
VCC = MAX, VI = 7.0V
VCC = MAX, VI = 5.5V
VCC = MAX, VI = 2.7V
VCC = MAX, VI = 2.1V, Bn â An = 0V
VCC = MAX, VI = 0.5V
VCC = MAX, VI = 0.3V
A0 â A7
VCC = MAX, VO = 2.7V
2.5
2.5
0.40
100 µA
100 µA
VCC
V
V
0.50 V
1.15 V
V
-0.5 V
-1.2 V
100 µA
1
mA
20 µA
100 µA
â20 µA
â100 µA
70 µA
IOZL + IIL
Offâstate output current,
lowâlevel voltage applied
A0 â A7
VCC = MAX, VI = 0.5V
â70 µA
IX
Highâlevel control current
VCC = MAX, VX = VCC, LE = OEA = OEBn =
2.7V, A0 â A7 = 2.7V, B0 â B7 = 2.0V,
VCC = MAX, VX = 3.13 & 3.47V, LE = OEA =
OEBn = A0 â A7 = 2.7V, B0 â B7 = 2.0V,
â100
â10
100 µA
10 µA
IOS
Short circuit output
current3
A0âA7
74F8960
VCC = MAX, Bn = 1.3V, OEA = 2.0V, OEBn =
2.7V
-60
only
only
âF8960
74F8961
VCC = MAX, Bn = 1.8V, OEA = 2.0V, OEBn =
2.7V
-150 mA
ICCH
VCC = MAX
65 100 mA
ICC
Supply current (total)
ICCL
VCC = MAX, VIL = 0.5V
100 145 mA
ICCZ
75 100 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type
and function table for operating mode.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for VIH =1.8v and VIL = 1.3V.
December 19, 1990
8
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