SAA5290 Datasheet, PDF (7/33 Pages) NXP Semiconductors – One page Economy Teletext/TV microcontroller

Philips Semiconductors
One page Economy Teletext/TV
microcontroller
Preliminary specification
SAA5290
QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Business group “Consumer Integrated
Circuits SNW-FQ-611-Part E” (see “Quality Reference Handbook”, order number 9398 510 63011). The principal
requirements are shown in Tables 1 to 4.
Group A
Table 1 Acceptance tests per lot
Mechanical
Electrical
TEST
REQUIREMENTS⁽¹⁾
cumulative target: <80 ppm
cumulative target: <80 ppm
Group B
Table 2 Processability tests (by package family)
TEST
Solderability
Mechanical
Solder heat resistance
<7% LTPD
<15% LTPD
<15% LTPD
REQUIREMENTS⁽¹⁾
Group C
Table 3 Reliability tests (by process family)
TEST
Operational life
CONDITIONS
168 hours at T_j = 150 °C
Humidity life
Temperature cycling performance
temperature, humidity, bias
1000 hours, 85 °C, 85% RH
(or equivalent test)
T_stg(min) to T_stg(max)
REQUIREMENTS⁽¹⁾
<1500 FPM; equivalent to
<100 FITS at T_j = 70 °C
<2000 FPM
<2000 FPM
Table 4 Reliability tests (by device type)
TEST
ESD and latch-up
CONDITIONS
ESD Human body model
2000 V, 100 pF, 1.5 kΩ
ESD Machine model
200 V, 200 pF, 0 Ω
latch-up 100 mA, 1.5 × V_DD
(absolute maximum)
Notes to Tables 1 to 4
1. ppm = fraction of defective devices, in parts per million.
LTPD = Lot Tolerance Percent Defective.
FPM = fraction of devices failing at test condition, in Failures Per Million.
FITS = Failures In Time Standard.
REQUIREMENTS⁽¹⁾
<15% LTPD
<15% LTPD
<15% LTPD
February 1995
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