74F456 Datasheet, PDF (7/12 Pages) NXP Semiconductors – Buffers/drivers

Philips Semiconductors
Buffers/Drivers
Product specification
74F455,* 74F456
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
High-level output voltage
V_OL
Low-level output voltage
V_CC = MIN,
V_IL = MAX,
I_OH=–3mA
±10%V_CC
±5%V_CC
2.4
2.7
3.3
V
V
V_IH = MIN
I_OH =–15mA ±10%V_CC
2.0
V
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OL = MAX
±10%V_CC
±5%V_CC
0.55
V
0.42 0.55
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
I_I
Input current at maximum input voltage V_CC = 0.0V, V_I = 7.0V
Dn
I_IH
High-level input current
V_CC = MAX, V_I = 2.7V
Pl, OEn
–0.73 –1.2
V
100
µA
40
µA
20
µA
Dn
I_IL
Low-level input current
V_CC = MAX, V_I = 0.5V
Pl, OEn
–40
µA
–20
µA
I_OZH
Off-state output current
High-level voltage applied
V_CC = MAX, V_O = 2.7V
50
µA
I_OZL
Off-state output current
Low-level voltage applied
V_CC = MAX, V_O = 0.5V
–50
µA
I_OS
Short-circuit output current³
V_CC = MAX
–100
–225
mA
I_CCH
50
80
mA
I_CC
Supply current (total)
I_CCL V_CC = MAX
78
110
mA
I_CCZ
63
90
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
t_PLH
t_PHL
t_PLH
t_PHL
t_PLH
t_PHL
t_PZH
t_PZL
t_PHZ
t_PLZ
Propagation delay
Dn to Qn
Propagation delay
Dn to Qn
Propagation delay
Dn to SE, SO
Output Enable time
to High or Low level
Output Disable time
from High or Low level
74F455
74F456
TEST
CONDITION
Waveform 2
Waveform 1
Waveform 1, 2
Waveform 3
Waveform 4
Waveform 3
Waveform 4
LIMITS
V_CC = +5V
T_amb = +25°C
C_L = 50pF, R_L = 500Ω
MIN TYP MAX
V_CC = +5V ± 10%
T_amb = 0°C to +70°C
C_L = 50pF, R_L = 500Ω
MIN
MAX
2.0
4.5
6.5
2.0
7.5
1.0
2.0
4.0
1.0
4.5
2.0
4.5
6.5
2.0
7.0
2.5
5.0
7.0
2.5
7.5
5.5 10.0 13.0
5.5
14.0
5.5 11.0 14.5
5.5
16.5
2.5
4.0
8.0
2.5
9.0
4.0
8.0 10.5
4.0
11.5
1.5
4.0
6.5
1.5
7.5
2.0
5.0
7.5
2.0
8.0
UNIT
ns
ns
ns
ns
ns
* Discontinued part. Please see the Discontinued Products List.
1999 Jan 08
7