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74AHC_AHCT1G04_15 Datasheet, PDF (7/14 Pages) NXP Semiconductors – Inverter
NXP Semiconductors
12. Waveforms
74AHC1G04; 74AHCT1G04
Inverter
$LQSXW
<RXWSXW
90
W3+/
90
Measurement points are given in Table 9.
Fig 6. Input (A) to output (Y) propagation delays
Table 9. Measurement point
Type
Input
74AHC1G04
74AHCT1G04
VI
GND to VCC
GND to 3.0 V
Input
VM
0.5  VCC
1.5 V
W3/+
PQD
Output
VM
0.5  VCC
0.5  VCC
38/6(
9,
*(1(5$725
9&&
92
'87
57
&/
PQD
Fig 7.
Test data is given in Table 8. Definitions for test circuit:
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Test circuit for measuring switching times
74AHC_AHCT1G04
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 9 — 10 March 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
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