PESDXL4UG Datasheet, PDF (6/9 Pages) NXP Semiconductors – Low capacitance quadruple ESD protection diode array in SOT353 package

Philips Semiconductors
Low capacitance quadruple ESD
protection diode array in SOT353 package
Product specification
PESDxL4UG series
ESD TESTER
R_Z
C_Z
450 Ω
RG 223/U
50 Ω coax
10 ×
ATTENUATOR
note 1
DIGITIZING
OSCILLOSCOPE
50 Ω
IEC 61000-4-2 network
C_Z = 150 pF; R_Z = 330 Ω
D.U.T.: PESDxL4UG
Note 1: attenuator is only used for open
socket high voltage measurements
vertical scale = 200 V/div
horizontal scale = 50 ns/div
GND2
vertical scale = 5 V/div
horizontal scale = 50 ns/div
PESD5V0L4UG
GND
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
GND
PESD3V3L4UG
GND1
clamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
GND
vertical scale = 200 V/div
horizontal scale = 50 ns/div
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
vertical scale = 5 V/div
horizontal scale = 50 ns/div
clamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
mce656
2004 Mar 23
Fig.6 ESD clamping test set-up and waveforms.
6