MB2646 Datasheet, PDF (6/16 Pages) NXP Semiconductors – Dual octal bus transceiver/registers 3-State

Philips Semiconductors Products
Dual octal bus transceiver/registers (3-State)
Product specification
MB2646
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
T_amb = +25°C
T_amb = –40°C
to +85°C
UNIT
MIN TYP MAX MIN MAX
V_IK
Input clamp voltage
V_OH High–level output voltage
V_OL
V_RST
Low–level output voltage
Power-up output
voltage^{NO TAG}
V_CC = 4.5V; I_IK = –18mA
V_CC = 4.5V; I_OH = –3mA; V_I = V_IL or V_IH
V_CC = 5.0V; I_OH = –3mA; V_I = V_IL or V_IH
V_CC = 4.5V; I_OH = –32mA; V_I = V_IL or V_IH
V_CC = 4.5V; I_OL = 64mA; V_I = V_IL or V_IH
V_CC = 5.5V; I_O = 1mA; V_I = GND or V_CC
–0.9 –1.2
–1.2 V
2.5 2.9
2.5
V
3.0 3.4
3.0
V
2.0 2.4
2.0
V
0.42 0.55
0.55 V
0.13 0.55
0.55 V
I_I
Input leakage Control pins V_CC = 5.5V; V_I = GND or 5.5V
current
Data pins V_CC = 5.5V; V_I = GND or 5.5V
±0.01 ±1.0
±5 ±100
±1.0 µA
±100 µA
I_OFF
I_PU/PD
I_IH + I_OZH
Power-off leakage current
Power-up/down 3-State
output current⁴
3–State output High current
V_CC = 0.0V; V_O or V_I ≤ 4.5V
V_CC = 2.1V; V_O = 0.5V; V_I = GND or V_CC;
V_OE = Don’t care
V_CC = 5.5V; V_O = 2.7V; V_I = V_IL or V_IH
±5.0 ±100
±5.0 ±50
5.0 50
±100 µA
±50 µA
50
µA
I_IL + I_OZL 3–State output Low current V_CC = 5.5V; V_O = 0.5V; V_I = V_IL or V_IH
–5.0 –50
–50 µA
I_CEX
I_O
Output High leakage current V_CC = 5.5V; V_O = 5.5V; V_I = GND or V_CC
Output current¹
V_CC = 5.5V; V_O = 2.5V
5.0 50
50
µA
–50 –80 –180 –50 –180 mA
I_CCH
V_CC = 5.5V; Outputs High, V_I = GND or V_CC
120 250
250 µA
I_CCL Quiescent supply current
V_CC = 5.5V; Outputs Low, V_I = GND or V_CC
37
60
60 mA
I_CCZ
V_CC = 5.5V; Outputs 3–State;
V_I = GND or V_CC
120 250
250 µA
∆I_CC
Additional supply current per V_CC = 5.5V; one input at 3.4V,
input pin²
other inputs at V_CC or GND
0.5 1.5
1.5 mA
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
4. This parameter is valid for any V_CC between 0V and 2.1V, with a transition time of up to 10msec. From V_CC = 2.1V to V_CC = 5V ± 10% a
transition time of up to 100µsec is permitted.
August 23, 1993
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