|
74HC1G00 Datasheet, PDF (6/16 Pages) NXP Semiconductors – 2-input NAND gate | |||
|
◁ |
Philips Semiconductors
2-input NAND gate
Product speciï¬cation
74HC1G00; 74HCT1G00
Family 74HCT1G
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
SYMBOL PARAMETER
TEST CONDITIONS
OTHER
VCC (V)
VIH
VIL
VOH
VOL
ILI
ICC
âICC
HIGH-level input
voltage
LOW-level input
voltage
HIGH-level output
voltage
VI = VIH or VIL;
IO = â20 µA
VI = VIH or VIL;
IO = â2.0 mA
LOW-level output
voltage
VI = VIH or VIL;
IO = 20 µA
VI = VIH or VIL;
IO = 2.0 mA
input leakage current VI = VCC or GND
quiescent supply
current
additional supply
current per input
VI = VCC or GND;
IO = 0
VI = VCC â 2.1 V;
IO = 0
4.5 to 5.5
4.5 to 5.5
4.5
4.5
4.5
4.5
5.5
5.5
4.5 to 5.5
Tamb (°C)
â40 to +85
â40 to +125
MIN. TYP.(1) MAX. MIN. MAX.
2.0 1.6
â
2.0 â
â
1.2
0.8 â
0.8
4.4 4.5
â
4.4 â
4.13 4.32
â
3.7 â
â
0
0.1 â
0.1
â
0.15
0.33 â
0.4
â
â
â
â
1.0 â
1.0
10
â
20
â
â
500 â
850
UNIT
V
V
V
V
V
V
µA
µA
µA
Note
1. All typical values are measured at Tamb = 25 °C.
2002 May 15
6
|
▷ |