74F779 Datasheet, PDF (6/12 Pages) NXP Semiconductors – 8-bit bidirectional binary counter 3-State

Philips Semiconductors
8-bit bidirectional binary counter (3-State)
Product specification
74F779
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
V_CC = MIN,
±10%V_CC
2.5
V
TC
V_IL = MAX I_OH = –1mA
V_IH = MIN
±5%V_CC
2.7
3.4
V
V_OH
High-level output voltage
V_CC = MIN,
±10%V_CC
2.4
V
I/On
V_IL = MAX I_OH = –3mA
V_IH = MIN
±5%V_CC
2.7
3.3
V
V_OL
Low-level output voltage
V_CC = MIN,
V_IL = MAX
V_IH = MIN
I_OL = MAX
±10%V_CC
±5%V_CC
0.30 0.50
V
0.35 0.50
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
I_I
Input current at maximum
input voltage
I/On
others
V_CC = 5.5V, V_I = 5.5V
V_CC = 5.5V, V_I = 7.0V
I_IH
High-level input current
except ^{VCC = MAX, VI = 2.7V}
I_IL
Low-level input current
I/On
V_CC = MAX, V_I = 0.5V
–0.73 –1.2
V
1
mA
100
µA
20
µA
–0.6
mA
I_IH+I_OZH
I_IL+I_OZL
Off-state output current
High-level voltage applied
I/On
Off-state output current
Low-level voltage applied
V_CC = MAX, V_O = 2.7V
V_CC = MAX, V_O = 0.5V
70
µA
–600
µA
I_OS
Short-circuit output current^{NO TAG}
V_CC = MAX
–60
–150
mA
I_CCH
82
116
mA
I_CC
Supply current (total)
I_CCL
V_CC = MAX
91
128
mA
I_CCZ
97
136
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST CONDITIONS
f_MAX
t_PLH
t_PHL
t_PLH
t_PHL
t_PLH
t_PHL
t_PZH
t_PZL
t_PHZ
t_PLZ
Maximum clock frequency
Propagation delay
CP to I/On
Propagation delay
CP to TC
Propagation delay
CET to TC
Output Enable time to
High or Low level
Output Enable time from
High or Low level
Waveform 1
Waveform 1
Waveform 1
Waveform 2
Waveform 4
Waveform 5
Waveform 4
Waveform 5
LIMITS
T_amb = +25°C
V_CC = +5V
C_L = 50pF, R_L = 500Ω
MIN
TYP MAX
T_amb = 0°C to +70°C
V_CC = +5V ± 10%
C_L = 50pF, R_L = 500Ω
MIN
MAX
125
145
115
4.5
7.0
10.5
4.5
11.0
5.5
8.0
10.5
5.5
11.0
4.5
7.0
9.0
4.5
10.0
4.5
7.0
9.0
4.5
10.0
3.0
4.5
6.5
2.5
7.5
3.0
5.5
7.5
2.5
8.0
2.5
4.5
7.0
2.5
8.0
4.5
6.5
9.0
4.5
9.5
1.0
3.0
6.5
1.0
8.0
1.0
4.0
7.0
1.0
8.0
UNIT
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
1989 Sep 20
6