74F777 Datasheet, PDF (6/12 Pages) NXP Semiconductors – Triple bidirectional latched bus transceiver 3-State open collector

Philips Semiconductors
Triple bidirectional latched bus transceiver (3–State +
Open Collector)
Product specification
74F777
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
I_OH
High–level output current B0 – B2
V_CC = MAX, V_IL = MAX, V_IH = MIN, V_OH = 2.1V
I_OFF
Power–off output current B0 – B2
V_CC = 0.0V, V_IL = MAX, V_IH = MIN, V_OH = 2.1V
V_OH
High-level output voltage A0 – A2⁴
A0 – A2⁴
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
V_CC = MIN,
I_OH = –3mA, V_X =V_CC
2.5
I_OH = –4mA, V_X = 3.13V
and 3.47V
2.5
I_OL = 20mA, V_X = V_cc
V_OL
Low-level output voltage B0 – B2
V_IL = MAX,
I_OL = 100mA
V_IH = MIN
I_OL = 4mA
0.40
V_IK
Input clamp voltage
A0 – A2
V_CC = MIN, I_I = I_IK
Except A0 – A2 V_CC = MIN, I_I = I_IK
I_I
Input current at
maximum input voltage
OEBn, OEAn,
LEn
V_CC = MAX, V_I = 7.0V
100 µA
100 µA
V_CC
V
V_X
V
0.50 V
1.15 V
V
-0.5 V
-1.2 V
100 µA
I_IH
I_IL
I_OZH + I_IH
High–level input current
Low–level input current
Off–state output current,
High level voltage applied
A0 – A2,
B0 – B2
OEBn, OEAn,
LEn
B0 – B2
OEBn, OEAn_,
LEn
B0 – B2
A0 – A2
V_CC = MAX, V_I = 5.5V
V_CC = MAX, V_I = 2.7V, Bn – An = 0V
V_CC = MAX, V_I = 2.1V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_I = 0.3V
V_CC = MAX, V_O = 2.7V
1
mA
20 µA
100 µA
–20 µA
–100 µA
70 ^µA
I_OZL + I_IL
Off–state output current,
Low level voltage applied
A0 – A2
V_CC = MAX, V_I = 0.5V
–70 ^µA
I_X
High level control current
V_CC = MAX, V_X = V_CC, LE = OEAn = OEBn = 2.7V,
A0 – A2 = 2.7V, B0 – B2 = 2.0V,
V_CC = MAX, V_X = 3.13 & 3.47V, LE = OEAn =
2.7V, OEBn = A0 – A2 = 2.7V, B0 – B2 = 2.0V
–100
–10
100 µA
10 µA
I_OS
Short circuit output
current³
A0 – A2 only
V_CC = MAX, Bn = 1.8V, OEAn = 2.0V,
OEBn = 2.7V
-60
-150 mA
I_CCH
V_CC = MAX
40 60 mA
I_CC
Supply current (total)
I_CCL
V_CC = MAX, V_IL = 0.5V
55 80 mA
I_CCZ
V_CC = MAX, V_IL = 0.5V
45 67 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, V_X =V_CC for all test condition.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V_IH =1.8v and V_IL = 1.3V.
May 19, 1992
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