74F657 Datasheet, PDF (6/12 Pages) NXP Semiconductors – Octal transceiver with 8-bit parit generator/checker

Philips Semiconductors
Octal transceiver with 8-bit parity generator/checker
Product specification
74F657
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
V_OH
High-level output voltage
All outputs
B0 – B7,
PARITY,
ERROR
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
TEST
CONDITIONS¹
I_OH = –3mA^4,5
I_OH = –12mA⁵
I_OH = –15mA⁴
V_OL
Low-level output voltage
V_IK
Input clamp voltage
Input current at
I_I
maximum input voltage
I_IH
High–level input current
A0 – A7
B0 – B7,
PARITY,
ERROR
OE, T/R,
ODD/EVEN
A0 – A7
B0 – B7
OOD/EVEN
OE, T/R
I_OL = 24mA^4,5
V_CC = MIN,
V_IL = MAX,
I_OL = 48mA⁴
V_IH = MIN
I_OL = 48mA⁵
I_OL = 64mA⁴
V_CC = MIN, I_I = I_IK
V_CC = 0.0V, V_I = 7.0V
V_CC = 5.5V, V_I = 5.5V
V_CC = MAX, V_I = 2.7V
I_IL
Low–level input current
OOD/EVEN V_CC = MAX, V_I = 0.5V
OE, T/R
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
±5%V_CC
LIMITS
MIN TYP² MAX
2.4
2.7
2.0
2.0
2.0
2.0
0.35 0.50
0.35 0.50
0.38 0.55
0.42 0.55
0.42 0.55
–0.73 -1.2
100
2
1
20⁴
40⁵
40⁴
80⁵
–20
–40
UNIT
V
V
V
V
V
V
V
V
V
V
V
V
µA
mA
mA
µA
µA
µA
µA
µA
µA
I_OZH + I_IH
Off–state output current,
high–level voltage applied
A0 – A7,
B0 – B7,
V_CC = MAX, V_O = 2.7V
70 ^µA
I_OZL + I_IL
Off–state output current,
low–level voltage applied
PARITY
V_CC = MAX, V_O = 0.5V
–70 ^µA
I_OZH
Off–state output current,
High–level voltage applied
ERROR
V_CC = MAX, V_O = 2.7V
50 ^µA
I_OZL
Off–state output current,
low–level voltage applied
I_OS
Short circuit output current³
I_CC
Supply current (total)
A0 – A7
B0 – B7
I_CCH
V_CC = MAX, V_O = 0.5V
V_CC = MAX
I_CCL
V_CC = MAX
–50 ^µA
-60
-150 mA
-100
-225 mA
90 125⁴ mA
90 135⁵ mA
106 150⁴ mA
106 160⁵ mA
I_CCZ
98 145 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
4. For commercial range.
5. For industrial range.
90 July 30
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