74F381 Datasheet, PDF (6/7 Pages) NXP Semiconductors – Arithmetic Logic Unit

Philips Semiconductors
Arithmetic Logic Unit
Product specification
74F381
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V_CC
V_IH
V_IL
I_IK
I_OH
I_OL
T_amb
Supply voltage
PARMETER
SYMBOL
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
UNIT
MIN
NOM
MAX
4.5
5.0
5.5
V
2.0
V
0.8
V
–18
mA
–1
mA
20
mA
0
70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
V_OH
High-level output voltage
V_CC = MIN, V_IL = MAX,
±10%V_{CC 2.5}
V
V_IH = MIN, I_OH = MAX
±5%V_{CC 2.7 3.4}
V
V_OL
Low-level output voltage
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = MAX
±10%V_CC
±5%V_CC
0.30 0.50 V
0.30 0.50 V
V_IK
Input clamp voltage
I_I
Input current at maximum input voltage
I_IH
High-level input current
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
–0.73 –1.2 V
100 µA
20 µA
I_IL
Low-level input current
An, Bn, Cn
S0, S1, S2
V_CC = MAX, V_I = 0.5V
–2.4 mA
–0.6 mA
I_OS
Short-circuit output current³
V_CC = MAX
–60
–150 mA
I_CC
Supply current (total)
V_CC = MAX
59 89 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1989 Mar 01
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