PESD1LIN-115 Datasheet, PDF (5/12 Pages) NXP Semiconductors – ESD protection of one automotive LIN-bus line

NXP Semiconductors
PESD1LIN
LIN-bus ESD protection diode
ESD TESTER
R_Z
C_Z
IEC 61000-4-2 network
C_Z = 150 pF; R_Z = 330 Ω
450 Ω
RG 223/U
50 Ω coax
D.U.T.
(Device
Under
Test)
10×
ATTENUATOR
4 GHz DIGITAL
OSCILLOSCOPE
50 Ω
vertical scale = 200 V/div
horizontal scale = 50 ns/div
GND
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
vertical scale = 20 V/div
horizontal scale = 50 ns/div
PESD1LIN (24V)
GND
GND
PESD1LIN (15V)
clamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
GND
GND
PESD1LIN (15V)
GND
PESD1LIN (24V)
vertical scale = 200 V/div
horizontal scale = 50 ns/div
unclamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
Fig 5. ESD clamping test setup and waveforms
vertical scale = 20 V/div
horizontal scale = 50 ns/div
clamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
006aaa166
PESD1LIN
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 31 May 2011
© NXP B.V. 2011. All rights reserved.
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