NE1618 Datasheet, PDF (5/16 Pages) NXP Semiconductors – Temperature monitor for microprocessor systems

Philips Semiconductors
Temperature monitor for microprocessor systems
Product data
NE1618
ELECTRICAL CHARACTERISTICS
V_DD = 3.3 V; T_amb = 5 °C to +120 °C; unless otherwise noted.
PARAMETER
CONDITIONS
MIN.
LIMITS
TYP. MAX.
UNIT
Temperature resolution
1
°C
Local temperature error
Remote temperature error
(1 °C resolution)
Extended Remote temp error
(0.125 °C resolution)
Extended relative temp error ²
(0.125 °C resolution)
Under voltage lockout ³
Power-on reset threshold
Power supply current (average)
T_amb = +60 °C to +100 °C
T_amb = 0 °C to +120 °C
T_remote = +60 °C to +100 °C
T_remote = 0 °C to +120 °C
T_remote = +70 °C to +100 °C
T_remote = 0 °C to +120 °C
T_remote = +70 °C to +100 °C
T_remote = 0 °C to +120 °C
V_DD input disables A/D conversion ⁴
V_DD input falling edge ⁵
Conversion data = 02h
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
V_DD = 3.3 V
V_DD = 5.0 V ¹
±0.75 ±1.5
°C
±1.25 ±2.0
°C
±2.0
±3.0
°C
±2.5
±3.5
°C
±3.0
°C
±3.5
°C
±5.0
°C
±5.5
°C
±1.0
°C
±1.5
°C
±3.0
°C
±3.5
°C
±0.25 °C
±0.75 °C
±0.50 °C
±1.0
°C
2.1
2.95 V
1.0
2.5
V
80
160
µA
Conversion data = 05h
100
270
µA
Power supply current (standby)
SMBus inactive
3
10
µA
Conversion time (busy duration)
Basic measurement
150
ms
Extended measurement
750
ms
Conversion rate error
Percentage error in programmed rate > 1 Hz ⁶
–30
+30
%
Remote sensor source current
HIGH level
100
µA
LOW level
10
µA
Address pin bias current
Momentary as the address is being read ^7,8
50
µA
NOTES:
1. The NE1618 is optimized for 3.3 V_DD operation. The listed accuracy limits for 5 V_DD operation are guaranteed by design and 100% QA
sample tested in production.
2. Guaranteed by design.
3. Definition of Under Voltage Lockout (UVL): The value of V_DD below which the internal A/D converter is disabled. This is designed to be a
minimum of 200 mV above the power-on reset. During the time that it is disabled, the temperature that is in the “read temperature registers”
will remain at the value that it was before the A/D was disabled. This is done to eliminate the possibility of reading unexpected false
temperatures due to the A/D converter not working correctly due to low voltage. In case of power-up (rising V_DD), the reading that is stored
in the “read temperature registers” will be the default value of 0 °C. V_DD will rise to the value of UVL, at which point the A/D will function
correctly and normal temperatures will be read.
4. V_DD (rising edge) voltage below which the ADC is disabled.
5. V_DD (falling edge) voltage below which the logic is reset.
6. For conversion rate ≤ 1 Hz, extended measurement requires about 400 ms more for conversion.
7. Address is read at power-up and at start of conversion for all conversions except the fastest rate.
8. Due to the bias current, any pull-up/down resistors should be ≤ 2 kΩ.
2002 Jan 04
5