CBT3251 Datasheet, PDF (5/10 Pages) NXP Semiconductors – CBT3251 1-of-8 FET multiplexer/demultiplexer

Philips Semiconductors
1-of-8 FET multiplexer/demultiplexer
Preliminary data
CBT3251
AC CHARACTERISTICS
T_amb = –40 to +85 °C; C_L = 50 pF
SYMBOL
PARAMETER
FROM (INPUT)
TO
(OUTPUT)
LIMITS
V_CC = +5.0 V ±0.5 V
MIN
MAX
UNIT
t_pd
Propagation delay¹
t_pd
Propagation delay
t_en
Output enable time
to High and Low level
A or B
B or A
—
0.25
ns
S
A
2
5.5
ns
S
B
1.5
5.6
ns
OE
A or B
1.6
5.8
ns
t_dis
Output disable time
from High and Low level
S
B
1.9
6.4
ns
OE
A or B
2.3
6.2
ns
NOTE:
1. The propagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance,
when driven by an ideal voltage source (zero output impedance).
AC WAVEFORMS
V_M = 1.5V, V_IN = GND to 3.0V
3V
INPUT
1.5 V
t_PLH
1.5 V
t_PHL
0V
V_OH
OUTPUT
1.5 V
1.5 V
V_OL
SA00028
Waveform 1. Input to Output Propagation Delays
Output Control
1.5 V
3V
1.5 V
t_PZL
Output
Waveform 1
S1 at 7 V
(see Note)
t_PZH
Output
Waveform 2
S1 at Open
(see Note)
1.5 V
1.5 V
t_PLZ
t_PHZ
0V
3.5 V
V_OL + 0.3 V
V_OL
V_OH
V_OH – 0.3 V
0V
Note:
Waveform 1 is for an output with internal conditions such that
the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that
the output is high except when disabled by the output control.
SA00571
Waveform 2. 3-State Output Enable and Disable Times
NOTES:
1. t_PLZ and t_PHZ are the same as t_dis.
2. t_PZL and t_PZH are the same as t_en.
3. t_PLH and t_PHL are the same as t_pd.
TEST CIRCUIT AND WAVEFORMS
From Output
Under Test
C_L = 50 pF
500 Ω
500 Ω
7V
S1
Open
GND
Load Circuit
TEST
S1
t_pd
t_PLZ/t_PZL
t_PHZ/t_PZH
open
7V
open
DEFINITIONS
C_L = Load capacitance includes jig and probe capacitance;
see AC CHARACTERISTICS for value.
SA00012
NOTES:
1. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 10 MHz, Z_O = 50 Ω, t_r ≤ 2.5 ns, t_f ≤ 2.5 ns.
2. The outputs are measured one at a time with one transition per
measurement.
2002 Sep 09
5